Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis

Maricau, Elie; Gielen, Georges

doi:10.1109/tcad.2010.2062870

Cited by 40 publications

(16 citation statements)

References 27 publications

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“…Although the elucidation of the physical phenomenon may be still under discussion, a lot of measured results and modeling have been reported [1][2][3][7][8][9]. Fig.…”

Section: B Btimentioning

confidence: 99%

“…As modern LSIs are used in most electronic equipment, reliability is becoming increasingly significant [1][2][3]. A malfunction that occurs after a product appears on the market may sometimes become a catastrophe.…”

Section: Introductionmentioning

confidence: 99%

“…The first is principally reliability factors by which device characteristics deteriorate with time, so-called time degradation, which include timedependent dielectric breakdown (TDDB) [4][5][6], negative bias temperature instability (NBTI) [1][2][3][7][8][9], hot-carrier injection (HCI) [1][2][3], electromigration (EM) [10][11][12][13][14], stress migration (SM), etc. The second is mainly design-dependent factors, which include latch up, electrostatic-discharge (ESD), electromagnetic interference (EMI), power-supply/crosstalk/substrate noises, and also soft-error as a design approach.…”

Section: Introductionmentioning

confidence: 99%

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Reasonable circuit analysis considering comprehensively reliability and variability

Kurokawa

Watanabe

Hoshi

et al. 2013

2013 13th International Symposium on Communications and Information Technologies (ISCIT)

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Circuit design in advanced CMOS technologies brings significant reliability and variability challenges. It is necessary to effectively handle the delay variation caused by various factors. In this paper, we make good use of the reliability models that have been proposed until now and present new models for simple and practical use. Then, we present an approach for circuit analysis that comprehensively considers reliability and variability. It includes time-dependent factors such as time-dependent dielectric breakdown (TDDB), bias temperature instability (BTI), hot-carrier injection (HCI), electromigration (EM), and random telegraph noise (RTN). Finally, in the analysis of a circuit with a gated clock, we demonstrate that analysis considering both reliability and variability is very important.

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“…Although the elucidation of the physical phenomenon may be still under discussion, a lot of measured results and modeling have been reported [1][2][3][7][8][9]. Fig.…”

Section: B Btimentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Reasonable circuit analysis considering comprehensively reliability and variability

Kurokawa

Watanabe

Hoshi

et al. 2013

2013 13th International Symposium on Communications and Information Technologies (ISCIT)

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show abstract

“…A designer can use this output netlist to study the impact of degradation on the product lifetime and to identify the reliability weak spots in the design. Fig.4.Variability-aware reliability analysis of analog circuits with parameter pre-screening and response surface modeling to achieve high efficiency [21].…”

Section: Reliability Analysis Of Analog Integrated Circuitsmentioning

confidence: 99%

“…A crude approach is to solve this with MonteCarlo analysis [20]. However, to avoid the time-consuming Monte-Carlo analysis, a more efficient variability-aware reliability analysis is presented in [21] and shown in Fig. 4.…”

Section: Reliability Analysis Of Analog Integrated Circuitsmentioning

confidence: 99%

Design automation towards reliable analog integrated circuits

Gielen¹,

Maricau²,

Wit³

2010

2010 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)

Self Cite

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Reliability is becoming one of the major concerns in designing integrated circuits in nanometer CMOS technologies. Problems related to degradation mechanisms like NBTI or soft breakdown, as well as increased external interference such as caused by crosstalk and EMI, cause timedependent circuit performance degradation. Variability only makes these things more severe. This creates a need for innovative design techniques and design tools that help designers coping with these reliability and variability problems. This tutorial paper gives a brief description of design tools for the efficient analysis and identification of reliability problems in analog circuits, as a first step towards the automated design of guaranteed reliable analog circuits.

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

McConaghy¹,

Breen²,

Dyck³

et al. 2013

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Efficient Variability-Aware NBTI and Hot Carrier Circuit Reliability Analysis

Cited by 40 publications

References 27 publications

Reasonable circuit analysis considering comprehensively reliability and variability

Reasonable circuit analysis considering comprehensively reliability and variability

Design automation towards reliable analog integrated circuits

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide

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