Efficient plant leaf disease detection using support vector machine algorithm and compare its features with Naive Bayes classification

Reddy, Y. Aravind; Adimoolam, M.

doi:10.1063/5.0174001

16th International Engineering and Computing Research Conference (Eureca)

2024

DOI: 10.1063/5.0174001

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Efficient plant leaf disease detection using support vector machine algorithm and compare its features with Naive Bayes classification

Y. Aravind Reddy,

M. Adimoolam

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Efficient plant leaf disease detection using support vector machine algorithm and compare its features with Naive Bayes classification

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References 34 publications

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