Efficient inductive coupled in-circuit impedance extraction with enhanced SNR and instrument protection

Fan, Fei; See, Kye Yak; Li, Kangrong; Banda, Joseph Kiran; Xiong, Lu; Gupta, Amit Kumar

doi:10.1109/isemc.2018.8393996

Cited by 3 publications

(1 citation statement)

References 8 publications

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“…Transient events and high excitation levels in an energized SUT can cause damage to the sensitive instrumentation. Therefore, protection devices must be incorporated in the SPS for practical applications [72]. This chapter describes the incorporation of protection devices to safeguard the instrumentation against transients and surges in a high voltage and high power energized SUT.…”

Section: Single-probe Setupmentioning

confidence: 99%

Single probe in-circuit impedance extraction based on inductive coupling approach

Weerasinghe¹

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The in-circuit impedance of a critical electrical system provides valuable information on its operating status and health. There are three common in-circuit impedance measurement approaches, namely the voltage-current (V-I) measurement approach, the capacitive coupling approach, and the inductive coupling approach. Among them, the inductive coupling approach does not require a direct electrical contact to the energized system-under-test (SUT) and therefore greatly simplifies the implementation without the need to shut down the system and eliminates the concern of electrical safety hazards.The conventional measurement setup of the inductive coupling approach requires two inductive probes and a two-port vector network analyzer (VNA) or a signal generation and data acquisition system (SGAS). This well-established two-probe setup (TPS) has been refined and improved over the years. Despite all these recent improvements, it still cannot eliminate the inherent probe-to-probe coupling which compromises the measurement accuracy when the two probes are placed very close to each other. This thesis develops an in-circuit impedance measurement setup with the use of only one inductive probe and it is experimentally verified. By introducing a single-probe setup (SPS), not only reduces the hardware overhead of the measurement setup but also fundamentally addresses the concern of probe-to-probe coupling. In addition, the proposed SPS incorporates power amplification and protection devices to maintain the measurement system's accuracy and improve the ruggedness for in-circuit impedance measurement of electrical systems in harsh electromagnetic environments with the presence of strong background noise and transient events. An error correction scheme has also been developed to recover measurement

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Section: Single-probe Setupmentioning

confidence: 99%

Single probe in-circuit impedance extraction based on inductive coupling approach

Weerasinghe¹

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Impact of Standardized Methods Applied for Conducted EMI Estimation on the Volume of an EMC Filter in a DC Supplied Single-leg Inverter

Seddighi

Costa

Lévy

et al. 2022

2022 IEEE 7th Southern Power Electronics Conference (SPEC)

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Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

Rhee,

Kim,

Chu

et al. 2024

IEEE Trans. Electromagn. Compat.

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Efficient inductive coupled in-circuit impedance extraction with enhanced SNR and instrument protection

Cited by 3 publications

References 8 publications

Single probe in-circuit impedance extraction based on inductive coupling approach

Single probe in-circuit impedance extraction based on inductive coupling approach

Impact of Standardized Methods Applied for Conducted EMI Estimation on the Volume of an EMC Filter in a DC Supplied Single-leg Inverter

Methodology for Extracting Low-Frequency Input Impedance of Personal Computer During Operation Using Dual Current Probes Method

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