2018
DOI: 10.1109/tc.2018.2865948
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Efficient Design-for-Test Approach for Networks-on-Chip

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Cited by 17 publications
(17 citation statements)
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References 27 publications
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“…Wang et al [19] proposed an efficient design for the test technique of NoC. In this research work, Esy Test and comprehensive test scheme with minimized influence have been proposed to improve the system performance.…”
Section: Literature Surveymentioning
confidence: 99%
“…Wang et al [19] proposed an efficient design for the test technique of NoC. In this research work, Esy Test and comprehensive test scheme with minimized influence have been proposed to improve the system performance.…”
Section: Literature Surveymentioning
confidence: 99%
“…Apparently, the method requires interrupting the connection in order to start the test. Some other methods to test TSVs in a Network-on-Chip use existing techniques of wire testing [25]- [28]. With smart scheduling of these methods, we can even obtain uninterrupted testing that allows the system to maintain its operation during test.…”
Section: Related Workmentioning
confidence: 99%
“…Most works require partial or total preemption in order to test. Works for online NoC-testing in [25]- [28] perform with lower-bound of test periods around 16,000 to 50,000 while still degrading the system performance.…”
Section: Introductionmentioning
confidence: 99%
“…The resilient NoC router evaluates the area and power overhead with a different application mechanism under error conditions. Wang et al [19] highlights the BIST (Built-in-self-Test) based NoC to improve the reliability. The quick fault detection and affected data packet detection are achieved using BIST.…”
Section: Literature Reviewmentioning
confidence: 99%