2007
DOI: 10.1246/cl.2007.762
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Efficiency Increase by Insertion of Electrodeposited CuSCN Layer into ITO/Organic Solid Interface in Bulk Hetero-junction Solar Cells Consisting of Polythiophene and Fullerene

Abstract: When an electrodeposited CuSCN thin film was inserted into the interface of ITO/P3HT:PCBM blended solid film (P3HT: regioregular poly(3-hexylthiophene), PCBM: soluble [6,6]-phenyl C61 buttyric acid methyl ester) in ITO/P3HT:PCBM/Al sandwich-type solar cells, the cell performance was remarkably improved, resulting in 2.5% of energy conversion yield under the irradiation of AM 1.5–100 mW/cm2 simulated sunlight.

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Cited by 21 publications
(15 citation statements)
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“…Takahashi et al demonstrated solar cells with ITO/CuSCN/P3HT:PCBM/Al structure and 2.5 % PCE. [42] In 2011, Sun et al demonstrated that arrayed nanorods of CuSCN can be electrodeposited from solution onto conducting substrates. [43] The nanostructure is nearly identical to the ZnO scaffold used extensively in solar-cell research, as can be seen in Figure 1 b.…”
Section: Resultsmentioning
confidence: 99%
“…Takahashi et al demonstrated solar cells with ITO/CuSCN/P3HT:PCBM/Al structure and 2.5 % PCE. [42] In 2011, Sun et al demonstrated that arrayed nanorods of CuSCN can be electrodeposited from solution onto conducting substrates. [43] The nanostructure is nearly identical to the ZnO scaffold used extensively in solar-cell research, as can be seen in Figure 1 b.…”
Section: Resultsmentioning
confidence: 99%
“…In the case of planar (layered) heterojunction P3HT:PCBM cells incorporating lowtemperature electrodeposited CuSCN HTLs, a marginally lower PCE of 2.5% was achieved, relative to devices with PEDOT:PSS (PCE = 2.6%) [123]. It was established that the cell's efficiency strongly depends on deposition parameters of CuSCN such as solution concentration and temperature.…”
Section: Organic Bulk-heterojunction Photovoltaic Cellsmentioning
confidence: 99%
“…(iii) Appropriate energy level alignment to allow ohmic contact to the donor material. (iv) Ambient chemical stability and inertness with respect to the adjacent device layers (34)(35)(36).…”
mentioning
confidence: 99%