2021
DOI: 10.1088/2515-7655/ac293e
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Efficiency as a performance metric for material optimization in thermoelectric generators

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Cited by 6 publications
(6 citation statements)
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“…Indeed, supposing that the whole leg's Seebeck coefficient changed from −90 µV/K to −110 µV/K (instead of only the areas close to the contacts), it can be deducted, using the Pisarenko plot in Figure S7 in SI, that the carrier concentration would change from n = 3.1 × 10 26 m −3 to n = 2.2 × 10 26 m −3 . It is known that for many material systems, including Mg 2 (Si,Sn) solid solutions, the zT, and therefore the efficiency, are not so sensitive to such a change in carrier concentration, as its peak extends on a broad n range [48].…”
Section: Discussionmentioning
confidence: 99%
“…Indeed, supposing that the whole leg's Seebeck coefficient changed from −90 µV/K to −110 µV/K (instead of only the areas close to the contacts), it can be deducted, using the Pisarenko plot in Figure S7 in SI, that the carrier concentration would change from n = 3.1 × 10 26 m −3 to n = 2.2 × 10 26 m −3 . It is known that for many material systems, including Mg 2 (Si,Sn) solid solutions, the zT, and therefore the efficiency, are not so sensitive to such a change in carrier concentration, as its peak extends on a broad n range [48].…”
Section: Discussionmentioning
confidence: 99%
“…Electrode‐induced defects with formation energies comparable to that of the relevant dopant defect will lead to comparable defect densities, but defects that reduce the carrier concentration (compensating defects) will diminish the TE performance more than defects that increase it (additive defects) as zT ( n ) and efficiency η( n ) reduce more rapidly toward lower majority carrier concentrations. [ 28 ] Thus, the most detrimental are defects with formation energies lower than the relevant dopant defect, with q ≤ −1 at E F = E CBM for n‐type and q ≥ +1 at E F = E VBM for p‐type. For this reason, the defect formation energies shown in Figure 1 are ordered according to their charge transition level from 0 (neutral defect) to −1 (electron compensating defect) in Figure 1a and 0 to +1 (hole compensating defect) in Figure 1b.…”
Section: Resultsmentioning
confidence: 99%
“…Rather, the averaged figure of merit is a better measure of efficiency [77]. Appropriate averages [78] as well as efficiency calculations considering the temperature dependence of the thermoelectric properties [79,80] can be readily obtained using the model introduced here. Overall, the experimental data is captured well by the 2PB model.…”
Section: Discussionmentioning
confidence: 99%