Pure and Zr-substituted CaCu 3 (Ti 1-x Zr x ) 4 O 12 (x = 0, 0.01, 0.02, 0.03) ceramics were prepared by the Pechini method. X-ray powder diffraction analysis indicated the formation of single-phase compound, and all the diffraction peaks were completely indexed by the bodycentered cubic perovskite-related structure. The effects of Zr 4? ion substituting partially Ti 4? ion on the dielectric properties were investigated in frequency range between 100 Hz and 1 GHz. The low frequency (f B 10 5 Hz) dielectric constant decreases with Zr substitution and the high frequency (f C 10 7 Hz) dielectric constant is unchanged. Interestingly, a low-frequency relaxation was observed at room temperature through Zr substitution. The observed dielectric properties in Zr-substituted samples were discussed using the internal barrier layer capacitor model. A corresponding equivalent circuit was adopted to explain the dielectric dispersion. The characteristic frequency of low-frequency relaxation rises due to the decrease of the resistivity of grain boundary with Zr substitution, which is likely responsible for the large low-frequency response at room temperature.