Effects of Total Ionizing Dose on Low Frequency Noise Characteristics in SiGe HBT

Wang, Xin; Li, Xiaolong; Zhang, Jinxin; Heini, Maliya; Liu, Mohan; Liu, Haitao

doi:10.1109/icreed59404.2023.10390894

2023 5th International Conference on Radiation Effects of Electronic Devices (ICREED) 2023

DOI: 10.1109/icreed59404.2023.10390894

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Effects of Total Ionizing Dose on Low Frequency Noise Characteristics in SiGe HBT

Xin Wang,

Xiaolong Li,

Jinxin Zhang

et al.

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Effects of Total Ionizing Dose on Low Frequency Noise Characteristics in SiGe HBT

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