2010
DOI: 10.1016/j.jlumin.2009.11.018
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Effects of thermal oxidation on the photoluminescence properties of porous silicon

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Cited by 25 publications
(12 citation statements)
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“…The latter results from the improved surface quality by the formation of a high-quality SiO 2 layer. 27 In fact, the XPS data in Fig. 5 show that the surface of Ni/PSi samples is more thickly oxidized with increasing C n .…”
Section: Photoluminescence Properties Of Ni/psi Powdersmentioning
confidence: 91%
“…The latter results from the improved surface quality by the formation of a high-quality SiO 2 layer. 27 In fact, the XPS data in Fig. 5 show that the surface of Ni/PSi samples is more thickly oxidized with increasing C n .…”
Section: Photoluminescence Properties Of Ni/psi Powdersmentioning
confidence: 91%
“…Etching time was 30 min. After etching, the prepared PSi powder was collected by filtering the etching solution and dried under ambient condition for 24 h. The PSi powder exhibited hydrophobicity due to the hydrogen termination although its surface is partially oxidized [49] as similar to PSi sample prepared by electrochemical etching. [50] For obtaining colloidal Si-nc samples, 100 mg of PSi powder was dispersed in an organic solvent with a volume of 3 mL in a quartz cuvette.…”
Section: Methodsmentioning
confidence: 99%
“…For the red PL from anodized bare Si, the mechanism involves the oxygen defects that are in the QC (arising from the Si nanoparticles). 20 In the case of nanoisland SiO x /Cu x O composite, the red PL still arose from the oxygen defects under QC effect. XPS spectrum ( Figure 2b) and HR-TEM (Fig.…”
Section: Photoluminescence Properties Of Nanoisland-structured Sio X mentioning
confidence: 99%