Abstract:If the crystallites in a polycrystalline sample are oriented, the intensity of a reflection will vary as a function of the orientation of the sample in the X-ray beam. This means that even if two reflections overlap in a conventional powder diffraction pattern (i.e. have the same d-value), their intensities are likely to vary differently as a function of sample orientation, so their individual intensities can be deduced if data are collected at different sample orientations. It has been shown that this princip… Show more
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