2013
DOI: 10.1063/1.4812334
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Effects of surface oxide formation on germanium nanowire band-edge photoluminescence

Abstract: Alternative surface passivation on germanium for metal-oxide-semiconductor applications with high-k gate dielectric Appl.

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Cited by 20 publications
(12 citation statements)
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“…We find that annealing in forming gas (hydrogen and nitrogen) at 350 °C increases the forward current by more than 50×. We attribute this to improved electrical contact between the metal on the tops of the nanowires and the graphene, as well as further passivation of surface states on the sidewall of the nanowires. , …”
Section: Passivation By Silicon Dioxidementioning
confidence: 76%
“…We find that annealing in forming gas (hydrogen and nitrogen) at 350 °C increases the forward current by more than 50×. We attribute this to improved electrical contact between the metal on the tops of the nanowires and the graphene, as well as further passivation of surface states on the sidewall of the nanowires. , …”
Section: Passivation By Silicon Dioxidementioning
confidence: 76%
“…The presence of germanium oxide is important because it strongly influences the performance of Ge QD-based devices. , The oxidation of Ge was investigated with XANES. The results are shown in Figure .…”
Section: Resultsmentioning
confidence: 99%
“…18,20) A suitable surface/interface passivation for Ge should be required, as in the case for Ge-channel metal-oxidesemiconductor field effect transistors. [21][22][23] So far, an enhanced photoluminescence (PL) intensity has been reported for surface-oxidized Ge 24) and Ge nanowires, 25) although no quantitative analysis on the recombination velocity at the Ge/GeO 2 interface has been reported yet. We have also reported a PL enhancement for Ge mesa structures selectively grown on Si after a wet chemical treatment in a CH 3 COOH/HNO 3 /HF/I 2 solution to induce a preferential etching of Ge near the defectrich Ge/Si interfaces.…”
Section: Introductionmentioning
confidence: 99%