Effects of Substrate Temperature on Nanomechanical Properties of Pulsed Laser Deposited Bi2Te3 Films

Abstract

The correlations among microstructure, surface morphology, hardness, and elastic modulus of Bi2Te3 thin films deposited on c-plane sapphire substrates by pulsed laser deposition are investigated. X-ray diffraction (XRD) and transmission electron microscopy are used to characterize the microstructures of the Bi2Te3 thin films. The XRD analyses revealed that the Bi2Te3 thin films were highly (00l)-oriented and exhibited progressively improved crystallinity when the substrate temperature (TS) increased. The hardness and elastic modulus of the Bi2Te3 thin films determined by nanoindentation operated with the continuous contact stiffness measurement (CSM) mode are both substantially larger than those reported for bulk samples, albeit both decrease monotonically with increasing crystallite size and follow the Hall—Petch relation closely. Moreover, the Berkovich nanoindentation-induced crack exhibited trans-granular cracking behaviors for all films investigated. The fracture toughness was significantly higher for films deposited at the lower TS; meanwhile, the fracture energy was almost the same when the crystallite size was suppressed, which indicated a prominent role of grain boundary in governing the deformation characteristics of the present Bi2Te3 films.

Temperature dependent Raman and photoresponse studies of Bi2Te3 thin films annealed at different temperatures for improved optoelectronic performance

“…They can occur due to various factors such as plastic deformation, thermal stresses, or the presence of foreign particles. Dislocation density can also be defined as follows: 30 The number of crystallites is contingent upon structural factors such as crystallite dimensions and the extent of clustering or agglomeration. Specifically, the number of crystallites is highly influenced by the size of the crystallites within the material.…”

“…Specifically, the number of crystallites is highly influenced by the size of the crystallites within the material. Hence, the number of crystallites per unit volume ( N C ) can be estimated by using the ‘ D ’ value, 30 …”

“…They can occur due to various factors such as plastic deformation, thermal stresses, or the presence of foreign particles. Dislocation density can also be defined as follows: 30 Dislocation density…”

Finite Element Analysis of Nanoindentation Responses in Bi2Se3 Thin Films

“…Nanoindentation is a popular technique being widely adopted to obtain prominent mechanical property parameters, such as the Young's modulus and hardness, with various materials, especially for film/substrate systems [7][8][9][10]. However, nanoindentation itself does not provide information about the mechanism of nanoindentation-induced deformation mechanisms and stress distribution within the film/substrate system in a direct manner, which, from a practical point of view, is more relevant to stress-induced deteriorations during device processing.…”