2005
DOI: 10.1016/j.surfcoat.2004.06.017
|View full text |Cite
|
Sign up to set email alerts
|

Effects of residual stress on the mechanical and structural properties of TiC thin films grown by RF sputtering

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

3
58
0

Year Published

2007
2007
2020
2020

Publication Types

Select...
7
2

Relationship

0
9

Authors

Journals

citations
Cited by 98 publications
(61 citation statements)
references
References 26 publications
3
58
0
Order By: Relevance
“…In the nanocomposite C 1s spectrum, an additional shoulder is observed at about ϳ283 eV binding energy between the C-C and Ti-C peaks, which we denote C-Ti ‫ء‬ . 3,7,[11][12][13][14][15][16] The intensity of this additional feature increases upon sputter etching. 17 However, recent studies with high-energy XPS have shown that it is present also in unsputtered samples.…”
Section: Introductionmentioning
confidence: 99%
“…In the nanocomposite C 1s spectrum, an additional shoulder is observed at about ϳ283 eV binding energy between the C-C and Ti-C peaks, which we denote C-Ti ‫ء‬ . 3,7,[11][12][13][14][15][16] The intensity of this additional feature increases upon sputter etching. 17 However, recent studies with high-energy XPS have shown that it is present also in unsputtered samples.…”
Section: Introductionmentioning
confidence: 99%
“…The most important property for surface hard coating is hardness, which is usually determined by indentation hardness tests at low test forces. Recently, the hardness of thin coating films of cutting tools has been measured by the nanoindentation method at considerably low test forces, e.g., 10 mN for a TiC coating 1) and 2 mN for a B 4 C coating.…”
Section: Introductionmentioning
confidence: 99%
“…But at a smaller scale, such as the AFM scanning area, the relatively constant angles between the parallel cracks and the interface indicate the local orientation of the TiC interlayer is mainly determined by the texture of Ti substrate and should follow the mechanism proposed above. The control of TiC ͑111͒ orientation has been achieved on Si ͑001͒ substrate, as demonstrated by Mani et al 26 …”
Section: Microcracks Tougheningmentioning
confidence: 99%