2003
DOI: 10.1007/s11664-003-0144-9
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Effects of moisture and elevated temperature on reliability of interfacial adhesion in plastic packages

Abstract: The interfacial-adhesion performance between the lead frame and molding compound was studied after temperature cycles and hygrothermal aging, simulating a typical package-assembly process. The hygrothermal aging involved a treatment at 85°C and 85% relative humidity (RH) for 168 h and three cycles of infrared (IR) solder-reflow condition. The interfacial-bond strengths were measured using shear and lead-pull tests. The lead-frame surface finishes studied include a bare Cu, microetched Cu, spot Ag coating, Ni, … Show more

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Cited by 28 publications
(3 citation statements)
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“…For instance, moisture diffusion through epoxy is the major cause of corrosion of metallic components in electronic packages. The adhesion of epoxy to a substrate is also adversely affected by moisture absorption [12], the degradation being particularly pronounced at temperatures higher than the glass transition temperature of epoxy [13]. Moisture may also be absorbed by uncured epoxy, thus affecting the cure kinetics of epoxy and the thermomechanical properties of the cured material.…”
Section: Introductionmentioning
confidence: 99%
“…For instance, moisture diffusion through epoxy is the major cause of corrosion of metallic components in electronic packages. The adhesion of epoxy to a substrate is also adversely affected by moisture absorption [12], the degradation being particularly pronounced at temperatures higher than the glass transition temperature of epoxy [13]. Moisture may also be absorbed by uncured epoxy, thus affecting the cure kinetics of epoxy and the thermomechanical properties of the cured material.…”
Section: Introductionmentioning
confidence: 99%
“…The average contact angles were recorded immediately after the droplets touched the substrate and at least 5 measurements were conducted for each test. The theoretical considerations of wetting are based on the Young-Dupre equation [14] that defines the work of adhesion, W a , between the liquid and solid as a function of contact angle θ:…”
Section: Characterization Of Nanocompositesmentioning
confidence: 99%
“…It should be noted that there is a concern of interface delamination phenomenon at the interface between LF (internal wiring material) and the epoxy resin (sealing material), because they are adhered by hydrogen bonding which shows weaker bonding strength compared to metallic bonding and covalent bonding, and moreover, the interface adhesive strength significantly drops under the high temperature/high humidity condition upon reflow. Such phenomenon is the main factor of package cracks, which is highly problematic for the reliability of semiconductor package .…”
Section: Introductionmentioning
confidence: 99%