Effects of ionizing radiation on integrated circuits

Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata

doi:10.1007/s00502-015-0380-8

Cited by 5 publications

(1 citation statement)

References 15 publications

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“…By analyzing the ENC curve, it can be concluded that the electronic devices can suffer from long-term radiation effects, and the effects are mostly due to electrons and protons [7]. Furthermore, this cumulative long term ionizing damage due to protons and electrons can cause devices to suffer threshold shifts, increased device leakage (and power consumption), timing changes, and decreased functionality [8,9]. It is also important to note that the preamplifier should match the impedance levels between the detector and the subsequent circuit.…”

Section: Resultsmentioning

confidence: 99%

ENC Measurement for ASIC Preamp Board as a Detector Module for PET System

Nagara

2016

Atom Indo.

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We developed a gamma ray detector with an LuAG:Pr scintillator and an avalanche photodiode as a detector for a positron emission tomography (PET) system. Studies have been performed on the influences of gamma irradiation on application-specific integrated circuit (ASIC) preamp boards used as a detector module. As a device used in nuclear environments for substantial durations, the ASIC has to have a lifetime long enough to ensure that there will be a negligible failure rate during this period. These front-end systems must meet the requirements for standard positron emission tomography (PET) systems. Therefore, an equivalent noise charge (ENC) experiment is needed to measure the front-end system's characteristics. This study showed that minimum ENC conditions can be achieved if a shorter shaping time could be applied.

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Section: Resultsmentioning

confidence: 99%