Effects of ion beam bombardment on electrochromic tungsten oxide films studied by X-ray photoelectron spectroscopy and Rutherford back-scattering

In situ HT‐XRD Study on the Formation of Hexagonal Ammonium Tungsten Bronze by Partial Reduction of Ammonium Paratungstate Tetrahydrate

“…[1,2] To check this for our HATB (Figure 3a), the W4f values of which (W4f 7/2 = 36.9 eV and W4f 5/2 = 34.8 eV) were in agreement with earlier results. [27,50,51] After refining the XPS spectrum belonging to the HATB sample (Figure 3b) [52][53][54] Zhan et al [32] also investigated a hexagonal ammonium tungsten bronze sample by XPS but they did not report the presence of W IV and W V atoms. Furthermore, in our HATB sample, NH 3 molecules (N1s = 399.7 eV) were also detected in addition to NH 4 + ions (N1s = 401.9 eV).…”

“…[32] Depth profiling by Ar + ion sputtering was not informative because sputtering distorted the structure so much that, due to oxygen loss, even W 0 species (W4f 7/2 = 32.5 eV and W4f 5/2 = 30.5 eV) appeared. [54][55][56] www.eurjic.org …”

Surface Functionalization of WO3 Thin Films with (3-Aminopropyl)triethoxysilane and Succinic Anhydride

“…The peak located at higher binding energies ($41.4 eV) are assigned to W5p 3/2 of the W 6+ ions. 21,[36][37][38][39][40][41][42] Figure 3b shows the XPS of the O 1s core level spectra of the WO 3 thin films. The O 1s core level spectra are clearly asymmetric.…”

“…The lowest intensity peak centered at 532.73 eV (O III ) can be attributed to the chemisorbed oxygen impurities as -CO 3 , adsorbed H 2 O or adsorbed O 2À . 21,[36][37][38][39][40][41][42] Figure 4 shows the FTIR spectra of both the unfunctionalized and functionalized WO 3 thin films: curve (1) is Si/WO 3 ; curve (2) is Si/WO 3 @Solvent- APTES; curve (3) is Si/WO 3 @solvent-APTES-SA; curve (4) is Si/WO 3 @O 2 plasma-APTES-SA; and curve (5) is Si/WO 3 @O 2 plasma-APTES-SA. The detailed FTIR spectra in the wavenumber range of 2000-400 cm À1 are presented in Fig.…”

Synthesis, characteristics and electrical properties of heteropoly compound Na2K3CuV(OH2)W11O39·16H2O permeated by Gd

“…XPS is a critical technique for the surface analysis, the constitution analysis and the structural analysis [12,13,[21][22][23][24]. Fig.…”