Abstract:Accelerated life-testing is much used in the reliability study of electronics. Failure criteria need to be assessed due to the application. For some applications even small changes in a variable used as failure criterion turns out to cause catastrophic failures while in another application even great fluctuation does not disturb the normal operation of the device. When the behaviour of the variable used as failure criterion is monitored prior to failure, regularities can be seen and thereby the starting failur… Show more
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