2014
DOI: 10.1117/12.2040153
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Effects of electric field on thermal and tunneling carrier escape in InAs/GaAs quantum dot solar cells

Abstract: The effects of electric field on carrier escape in InAs/GaAs quantum dots embedded in a p-i-n solar cell structures have been studied by quantum efficiency. Via band structure simulation, effective barrier height of carriers inside QDs is reduced with increasing local electric field, so tunneling and thermal escape are enhanced. At 300K, when electric field intensity is below 40kV/cm, thermal escape is dominant in all confined states in QDs; when electric field intensity is above 40kV/cm, tunneling is dominant… Show more

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Cited by 5 publications
(4 citation statements)
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“…Optically promoted intersubband escape of carriers by absorption of infrared photons may be important at lower temperatures, for which thermal and tunneling escape events become significantly reduced [11]. Tunneling-assisted escape can be dominant in the shallower energy levels for high local electric field intensities (>50 kV cm −1 ) [47], a limiting value very much above the electric field profiles observed in our simulations. Capture and relaxation time constants are determined from experimental data [27], whereas the thermal escape times are calculated from the rate equations, by assuming that the structure reaches a quasi-Fermi equilibrium in the absence of recombination and photogeneration processes [48], leading to the expression…”
Section: Numerical Modelmentioning
confidence: 54%
“…Optically promoted intersubband escape of carriers by absorption of infrared photons may be important at lower temperatures, for which thermal and tunneling escape events become significantly reduced [11]. Tunneling-assisted escape can be dominant in the shallower energy levels for high local electric field intensities (>50 kV cm −1 ) [47], a limiting value very much above the electric field profiles observed in our simulations. Capture and relaxation time constants are determined from experimental data [27], whereas the thermal escape times are calculated from the rate equations, by assuming that the structure reaches a quasi-Fermi equilibrium in the absence of recombination and photogeneration processes [48], leading to the expression…”
Section: Numerical Modelmentioning
confidence: 54%
“…For further understanding of the UV responses and device performances, the tunneling property within the Si-QD layer should be considered. Yushuai et al reported that the tunneling rate decreases when an insufficient electric filed is formed in QD solar cell [24]. Accordingly, to confirm whether a sufficient field is formed during the device operation, we carried out the EQE measurement in the UV region (300-400 nm) by applying an external bias voltage from 0 to −1 V shown in figure 8.…”
Section: Resultsmentioning
confidence: 99%
“…The escape of holes, because of their shallow confinement, is essentially thermally-driven, whereas a more complex picture may underlie the electrons escape. In fact, thermal escape is usually dominant for the escape from GS, whereas tunnelling can be significant for the higher energy states under high electric fields, on the order at least of a few tens of kV/cm as reported, for example, in [9,16]. Clearly, the relative strength of thermal-assisted or tunnelling-assisted mechanisms on the escape rate is very dependent on the QD energy levels and device structure as well.…”
Section: Model Overviewmentioning
confidence: 96%
“…However, while a significant amount of experimental and theoretical works has focused on the investigation of carrier dynamics in QD lasers and semiconductor optical amplifiers [6], [7], [8], less effort has been put on studying carrier dynamics in QD solar cells, with emphasis on evaluating carrier lifetime in QD states [4] and carrier escape mechanisms [9]. Capture dynamics and intersubband processes in the cell under forward bias still remain to be investigated.…”
Section: Introductionmentioning
confidence: 99%