Effects of different boundary conditions on free mode test

Zhao, Yanyan; Chen, Hao; Cao, Yue; Tan, Wenjun; Dong, Quanliang

doi:10.1109/iceemt59522.2023.10263061

2023 3rd International Conference on Electrical Engineering and Mechatronics Technology (ICEEMT) 2023

DOI: 10.1109/iceemt59522.2023.10263061

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Effects of different boundary conditions on free mode test

Yanyan Zhao,

Hao Chen,

Yue Cao

et al.

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Effects of different boundary conditions on free mode test

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