Effects of depolarization of polarimetric components on null ellipsometry

Nee, Soe-Mie F.; Cole, Teresa

doi:10.1016/s0040-6090(97)00776-1

Cited by 19 publications

(4 citation statements)

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“…It would be desirable to carry out transmission measurements on a thin 4H SiC platelet for an accurate determination of the absorption coefficient just above the indirect gap. 4 The depolarization of an isotropic sample can be caused by a number of factors, 22,23,45 such as: ͑i͒ layer thickness nonuniformity, ͑ii͒ patterned substrates, ͑iii͒ finite spectral bandwidth of the monochromator, ͑iv͒ finite angular bandwidth when focusing the light on the sample, and ͑v͒ backside effects for transparent substrates. 21 For our SiCOI sample, the depolarization ͑not shown in Fig.…”

Section: H Sic On Insulator "Sicoi…mentioning

confidence: 99%

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si

Zollner

Chen

Duda

et al. 1999

Journal of Applied Physics

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Articles you may be interested inVisible to vacuum ultraviolet dielectric functions of epitaxial graphene on 3C and 4H SiC polytypes determined by spectroscopic ellipsometry Details of below band-gap uniaxial dielectric function of SiC polytypes studied by spectroscopic ellipsometry and polarized light transmission spectroscopy Spectroscopic rotating-analyzer ellipsometry employing a compensator and optical transmission were used to measure the dielectric functions of bulk 4H and 6H SiC from 0.72 to 6.6 eV for light propagating nearly parallel to the hexagonal axis. The measurements below the band gap show the presence of a thin surface layer, which was modeled as SiO 2 . The data are similar to results for cubic ͑3C͒ and 6H SiC from the literature, but differences are notable, particularly above 4 eV. At 5.56 eV, we observe a critical point in 4H SiC, which is assigned to direct interband transitions along the UϭM ϪL axis in the hexagonal Brillouin zone after comparison with band structure calculations. No evidence for direct transitions below 6.5 eV was found in 6H SiC. We apply our results to the analysis of a 4H SiC film on insulator ͑SiCOI͒ produced by high-dose hydrogen implantation and direct wafer bonding on Si. For comparison, we also studied a 1 m thick epitaxial layer of 3C SiC on Si, where the interference oscillations are influenced by surface and interface roughness.

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Section: H Sic On Insulator "Sicoi…mentioning

confidence: 99%

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si

Zollner

Chen

Duda

et al. 1999

Journal of Applied Physics

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“…More significantly, the depolarization effect will have an influence on the measurement accuracy, and it must be considered in the optical model. Several researchers have investigated the depolarization effect of polarimetric components such as polarizers and compensators in previous work [3,4] . In this work, we focus on the depolarization effect of bandwidth in MMIP and demonstrate that this effect can induce significant measurement errors.…”

Section: Introductionmentioning

confidence: 99%

Depolarization effect of bandwidth in Mueller matrix imaging polarimetry

Zhang

Chen

et al. 2014

Classical Optics 2014

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“…2, which shows a significant decrease in the degree of polarization of transmitted light (the ratio of transmitted light power measured at transmission-maximum and transmission-minimum of a polarizer) with increased DLS. As a result, the performance of conventional polarimeters deteriorates badly in the presence of DLS (Nee and Cole, 1998;Chaikovskaya and Zege, 1999). Consequently, conventional polarimeters require the user to prepare "optically clean" samples, that is, samples essentially free of scattering structures and its resulting DLS.…”

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confidence: 99%

Astrobiological Polarimeter

et al. 2008

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Chirality is an excellent indicator of life, but naturally occurring astrobiological (as well as terrestrial) samples nearly always exhibit massive depolarizing light scattering, which renders conventional polarimeters useless. For astrobiological applications, we instead consider a novel polarimeter originally developed for non-invasive human-glucose measurement. It involves deliberately rotating in time the plane of polarization of a linearly polarized beam and detecting the shift in the plane of the rotating linearly polarized component of the transmitted light from a chiral sample relative to the input polarization plane. We find that this polarimeter can operate in 3 orders of magnitude more depolarizing scattering than conventional polarimeters. Furthermore, it can also be designed to be lightweight, compact, and energy efficient.

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Effects of depolarization of polarimetric components on null ellipsometry

Cited by 19 publications

References 4 publications

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si

Dielectric functions of bulk 4H and 6H SiC and spectroscopic ellipsometry studies of thin SiC films on Si

Depolarization effect of bandwidth in Mueller matrix imaging polarimetry

Astrobiological Polarimeter

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