2009
DOI: 10.1016/j.jallcom.2008.06.015
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Effects of cation stoichiometry on the dielectric properties of CaCu3Ti4O12

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Cited by 56 publications
(31 citation statements)
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“…Based on our previous report [28] of Cu volatility occurred over its melting temperature of 1084.6°C [29], the larger Cu volatility in CCTO at the higher sintering temperature might be responsible for the increased dielectric constant indicated by the lower bulk resistivity of CCTO samples. The evidence of the non-stoichiometric CCTO has been previously reported [17,[30][31], but the further investigation of its defect chemistry is necessary and this might provide the clues for the better understanding of the property-structure relationship in CCTO ceramics.…”
Section: Resultsmentioning
confidence: 96%
“…Based on our previous report [28] of Cu volatility occurred over its melting temperature of 1084.6°C [29], the larger Cu volatility in CCTO at the higher sintering temperature might be responsible for the increased dielectric constant indicated by the lower bulk resistivity of CCTO samples. The evidence of the non-stoichiometric CCTO has been previously reported [17,[30][31], but the further investigation of its defect chemistry is necessary and this might provide the clues for the better understanding of the property-structure relationship in CCTO ceramics.…”
Section: Resultsmentioning
confidence: 96%
“…To clarify the origin of their giant dielectric properties, the related electrical properties of CCTO ceramics have been intensively studied. It is clear that CCTO ceramics are electrically heterogeneous, consisting of insulating grain boundaries (GBs) and semiconducting grains [2][3][4][5][6][7][8][9][10][11][12]. However, the mechanism related to the origin of the n-type semiconductivity of grain interiors is still unclear.…”
Section: Introductionmentioning
confidence: 99%
“…As a result, the investigations of electrical properties of grains and GBs [2][3][4][5][6][7][8][9][10][11][12], especially the elegant investigation of Chung et al [3], it is now widely accepted that giant ε response in CCTO ceramics is mainly attributed to an internal barrier layer capacitor (IBLC) effect. This results from semiconducting properties of grain interiors and insulating layers of GBs.…”
Section: Introductionmentioning
confidence: 99%
“…Outros fatores como tipo e quantidade de impurezas presentes nos materiais de partida, também exercem grande influência na resistividade elétrica das cerâmicas sinterizadas. Kwon [27] A relaxação dielétrica é um parâmetro importante na elucidação das propriedades dielétricas em materiais policristalinos, sendo possível identificá -la a partir de resultados de técnicas de resposta em frequência, como espectroscopia de impedância. Cada região da microestrutura pode responder de maneira diferente à frequência de oscilação de um campo elétrico, variando a contribuição da polarização para a permissividade elétrica [69].…”
Section: Reação Em Estado Sólido (Mo)unclassified
“…Nas amostras padrão notou-se que a resistividade elétrica das amostras aumenta com o aumento da temperatura (de 1070 a 1090°C), de forma análoga aos materiais obtidos por mistura de óxidos . Quando a temperatura de sinterização atinge 1100°C a resistividade diminui, o que pode estar relacionado com a perda de estequiometria de cobre no CCTO, como descrito por Kwon [27].…”
Section: Complexação De Cátions (Ca)unclassified