2020
DOI: 10.1016/j.jallcom.2020.156631
|View full text |Cite
|
Sign up to set email alerts
|

Effects of annealing temperature, thickness and substrates on optical properties of m-plane ZnO films studied by photoluminescence and temperature dependent ellipsometry

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
4
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
8

Relationship

0
8

Authors

Journals

citations
Cited by 12 publications
(4 citation statements)
references
References 48 publications
0
4
0
Order By: Relevance
“…[ 31,32 ] The larger E g value of TiO 2 thin film than E g value of bulk TiO 2 frequently is ascribed to strain values and crystal quality of thin films as that pointed out for ZnO thin film. [ 33–36 ] In addition, another crucial parameter that has an effect on the optical bandgap is the thickness, which can lead to occur quantum confinement effect and change of localized density of states in the thin film. [ 37,38 ] The obtained E g values in this study are consistent with the reported studies in the literature.…”
Section: Resultsmentioning
confidence: 99%
“…[ 31,32 ] The larger E g value of TiO 2 thin film than E g value of bulk TiO 2 frequently is ascribed to strain values and crystal quality of thin films as that pointed out for ZnO thin film. [ 33–36 ] In addition, another crucial parameter that has an effect on the optical bandgap is the thickness, which can lead to occur quantum confinement effect and change of localized density of states in the thin film. [ 37,38 ] The obtained E g values in this study are consistent with the reported studies in the literature.…”
Section: Resultsmentioning
confidence: 99%
“…These materials are sensitive to external effects such as temperature, external fields, and pressure, in addition to the value of their physical characteristics which make them good candidates for sensors of several types [8]. Several experimental and theoretical works have been published on some of the properties of semiconductor alloys, but, no sufficient data is available for the acoustic velocity and phonon frequencies under pressure and temperature [8][9][10][11][12][13][14][15][16][17][18][19][20][21]. Insufficient methods have been developed to find out the semiconductor band structure, including the (EPM) [22][23][24][25][26][27][28].…”
Section: Introductionmentioning
confidence: 99%
“…25,26 Although there are many reports regarding the effects of annealing treatment on the properties of ZnO film grown by conventional thermal ALD and other film growth methods. [27][28][29][30] Virtually, its effects may be different for films grown by different techniques. So far, systematic investigation on the effects of annealing treatment on sALD-ZnO film is still in lack.…”
mentioning
confidence: 99%