2013
DOI: 10.7567/jjap.52.110111
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Effective Young's Modulus Measurement of Thin Film Using Micromechanical Cantilever Sensors

Abstract: Determination of mechanical properties of thin films, such as the Young's modulus, is of fundamental importance when the films are used for coating or for materials of microelectromechanical systems (MEMS). We show a simple method to calculate the effective Young's modulus of thin films by comparing lateral and vertical expansions. The stress of the film due to expansion in the lateral direction was measured using micromechanical cantilever sensor (MCS) techniques which allow for a calculation of the lateral e… Show more

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Cited by 5 publications
(5 citation statements)
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“…The deflection behavior of MCS can be described as being similar to the bending of a bi‐metallic strip upon temperature changes . The change in deflection Δδ of a bi‐material strip upon humidity changes ΔH is given by Δδ=l22R=3l2ESiEfilmtSitfilmtrue(tSi+tfilmtrue)(ESitSi2)2+(Efilmtfilm2)22ESiEfilmtSitfilmtrue(2tSi2+3tSitfilm+2tfilm2true)true(αfilmαSitrue)ΔH where αfilm and αSi are linear expansion coefficients of film and Si at a given H , ESi and Efilm are E of Si and film, tSi and tfilm are thicknesses of the Si cantilever beam and film, l is a length of the cantilever beam. The geometric values of l, tSi, and tf...…”
Section: Measurement Principlesmentioning
confidence: 99%
“…The deflection behavior of MCS can be described as being similar to the bending of a bi‐metallic strip upon temperature changes . The change in deflection Δδ of a bi‐material strip upon humidity changes ΔH is given by Δδ=l22R=3l2ESiEfilmtSitfilmtrue(tSi+tfilmtrue)(ESitSi2)2+(Efilmtfilm2)22ESiEfilmtSitfilmtrue(2tSi2+3tSitfilm+2tfilm2true)true(αfilmαSitrue)ΔH where αfilm and αSi are linear expansion coefficients of film and Si at a given H , ESi and Efilm are E of Si and film, tSi and tfilm are thicknesses of the Si cantilever beam and film, l is a length of the cantilever beam. The geometric values of l, tSi, and tf...…”
Section: Measurement Principlesmentioning
confidence: 99%
“…In this case upon exposure to humidity, water molecules diffuse into the PEM film resulting in a swelling of the film. Depending on the mechanical properties of the films, the swelling induces a stress that leads to a deflection of the NMC. , Thus simultaneously to the measured frequency changes we also followed the deflections of the NMCs (Figure c). Upon increasing the humidity, the PEM-coated NMC deflected away from the polymer coating as expected for swelling of the PEM.…”
Section: Resultsmentioning
confidence: 99%
“…From this plot it is clear that the deflection does not depend solely on the humidity change Δ H as described by equation normalΔ δ = l 2 2 R = 3 l 2 E Si E film h Si h film ( h Si + h film ) false( E Si h Si 2 false) 2 + false( E film h film 2 false) 2 + 2 E Si E film h Si h film ( 2 h Si 2 + 3 h Si h film + 2 h film 2 ) α solv normalΔ H where l is the length and R is the curvature of the bending NMC. E Si and E film are the Young’s moduli of Si and the film on the NMC, respectively …”
Section: Resultsmentioning
confidence: 99%
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“…For example, Depth Sensing Indentation (DSI) method is used for relatively small amounts of testing materials and there are no strict requirements for a sample shape [2]. Nanoindentation [3], phase velocity [4], micromechanical cantilever [5] techniques are used for Young's modulus determining in thin film material. In case of small dimension samples interferometric strain/displacement gage (ISDG) technique can be used [6].…”
Section: Introductionmentioning
confidence: 99%