Effective tip radius in electrostatic force microscopy

Sacha, G. M.; Verdaguer, Albert; Martínez, Juan Francisco González; Sáenz, Juan José; Ogletree, D. Frank; Salmerón, Miquel

doi:10.1063/1.1884764

Cited by 66 publications

(41 citation statements)

References 25 publications

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“…This value is onehalf that obtained from the capacitance model in the inert solvent. Possible reasons for this discrepancy are (1) the lower γ value of the tip, as indicated by the lower coverage in the previous section, and/or (2) difference in effective tip radius due to different interaction ranges [43]. Figure 5 shows approach force curves between C 10 H 21 SH SAMs taken in the 0.05 M HClO 4 solution at various tip and sample potentials.…”

Section: Resultsmentioning

confidence: 99%

Force Curve Measurements between n-Decanethiol Self-Assembled Monolayers in Inert Solvent and in Electrochemical Environment

Yokota

Yamada

Kawai

2009

e-J. Surf. Sci. Nanotechnol.

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It was revealed that electrostatic forces between electrodes under the applied bias are almost completely suppressed by an electrochemical potential control. The force operating between n-decanethiol self-assembled monolayers (SAMs) on gold was examined by atomic force microscopy in liquid n-dodecane and in an aqueous solution of HClO4. In inert n-dodecane, the bias voltage was simply applied between the tip and the sample, and the force curve exhibited a long-range attractive force in accordance with the simple capacitance model. Meanwhile under the independent control of the tip and sample potentials in HClO4, the force curve did not depend on the applied potentials due to the small double-layer capacitance.

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Section: Resultsmentioning

confidence: 99%

Force Curve Measurements between n-Decanethiol Self-Assembled Monolayers in Inert Solvent and in Electrochemical Environment

Yokota

Yamada

Kawai

2009

e-J. Surf. Sci. Nanotechnol.

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“…The tip radius can be extracted from the force-distance curves as described in previous work [19] that shows that the effective tip radius is given by R 36A=V 2 , where A is the slope in the plot of electrostatic force F, versus 1=D, F is in nanonewtons, 1=D in nm ÿ1 , V in volts, and R in nm, as shown in the inset of Fig. 3.…”

mentioning

confidence: 99%

Sensing Dipole Fields at Atomic Steps with Combined Scanning Tunneling and Force Microscopy

et al. 2005

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“…Electrostatic forces consist of three contributions: from the lever, tip cone, and tip apex. [34][35][36] In the first harmonic of the ac component of the bias voltage, electrostatic signal contributions scale linearly with the applied dc voltage. In the absence of large-scale permanent charges in a sample, the contributions from the lever and cone are strictly directly proportional to the dc bias without any offset, while the contribution from the tip apex may exhibit an offset V off es due to a local nonzero surface potential, which can be altered by charge injection from the tip during application of a bias.…”

Section: Resultsmentioning

confidence: 99%

Quantitative Nanometer‐Scale Mapping of Dielectric Tunability

Tselev

Klein

Gaßmann

et al. 2015

Adv Materials Inter

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usual approach to characterization of the thin fi lms dielectric properties assumes fabrication of sandwich (parallel-plate) or planar (interdigitated) capacitors or coplanar waveguides from micrometer to tens and hundreds of micrometers in dimensions. [5][6][7] Apparently, such approach is capable of delivering information only about fi lm properties averaged over a relatively large area. While this can be appropriate for single-crystalline epitaxial thin fi lms, the information about properties of single morphological elements of polycrystalline fi lms-such as fabricated by magnetron sputtering-cannot be obtained. Additionally, only macroscopic scale devices can be characterized. Fabrication of test devices is destructive for thin fi lms with a consequence that generally, characterized fi lms cannot be further used for fabrication of desired functional structures.Furthermore, a problem for polycrystalline fi lms are always pinholes leading to shorts in capacitor structures. The density of the pinholes increases with decreasing fi lm thickness, so that sample with a thicknesses of about 50 nm and below are hardly accessible to the measurements with lithographically fabricated capacitor structures since the electrodes should be made very small. On the other side, in general, thinner fi lms show worse performance than thicker fi lms, often related to "dead layers," i.e., layers with reduced permittivity and tunability at the electrode interfaces. A possibility to measure dielectric properties without top electrodes can help to discriminate between dead layers at bottom and at top electrodes as well as fi lm defects and, therefore, guide the development of improved bottom or top electrodes in the tunable devices. Therefore, noninvasive and nondestructive characterization methods capable of a high spatial resolution are required. The scanning probe techniques offer the opportunity of accessing the dielectric properties of nanoscale thin fi lms without the extensive effort of lithographically structured electrodes.In this paper, we used two scanning probe microscopy techniques-near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)-to characterize and image tunability in a thin paraelectric fi lm. Using a polycrystalline Ba 0.6 Sr 0.4 TiO 3 (BST) fi lm as a model system, we prove that near-fi eld microwave imaging and PFM provide similar information about dielectric tunability with high spatial resolution in the 10's of nm regime. This is key to understand the origin of macroscopic material properties and its correlation to the underlying microstructure and defects as pathway for material Two scanning probe microscopy techniques-near-fi eld scanning microwave microscopy (SMM) and piezoresponse force microscopy (PFM)-are used to characterize and image tunability in a thin (Ba,Sr)TiO 3 fi lm with nanometer scale spatial resolution. While sMIM allows direct probing of tunability by measurement of the change in the dielectric constant, in PFM, tunability can be extracted via electrostrict...

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Effective tip radius in electrostatic force microscopy

Cited by 66 publications

References 25 publications

Force Curve Measurements between n-Decanethiol Self-Assembled Monolayers in Inert Solvent and in Electrochemical Environment

Force Curve Measurements between n-Decanethiol Self-Assembled Monolayers in Inert Solvent and in Electrochemical Environment

Sensing Dipole Fields at Atomic Steps with Combined Scanning Tunneling and Force Microscopy

Quantitative Nanometer‐Scale Mapping of Dielectric Tunability

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