A 19.8% conversion efficiency has been achieved by formation of a nanocrystalline Si layer on the front surface and a submicron-textured reflector on the rear surface of monocrystalline Si solar cells. The nanocrystalline Si layer with a thickness of $200 nm formed by the surface structure chemical transfer (SSCT) method significantly decreases the front surface reflectance to less than 3%, while the submicron-textured rear surface formed by the metal-assisted chemical etching (MACE) method enhances light absorption inside Si. Both the reaction rates of the SSCT and MACE methods do not depend on crystal orientations, and therefore, these methods are applicable to polycrystalline Si solar cells. Reflectance spectra in the wavelength region longer than 950 nm of the nanocrystalline Si layer/Si structure show that the submicron-textured reflector has excellent light trapping effect equivalent to the pyramidal textured reflector. Due to this light trapping effect, the short-circuit photocurrent density of the nanocrystalline Si solar cells has been improved to 41.6 mA cm À2 .Black Si can achieve ultralow reflectance surfaces in wide wavelength and angle regions, and its application to solar cells can avoid formation of anti-reflection coating produced by use of expensive vacuum equipments such as plasma-enhanced chemical vaper deposition (PECVD). [1][2][3][4][5] Therefore, black Si solar cells can increase the light absorption probability and decrease the cell production cost. The ultralow reflectance of black Si results from formation of surface structures much smaller than the wavelength of incident light, in which the refractive index of the structure gradually changes with the depth from the surface.We have developed a simple method to produce black Si, i.e., the surface structure chemical transfer (SSCT) method, in which Si wafers immersed in an HF plus H 2 O 2 solution are just contacted with a Pt catalyst. [6] By the SSCT treatment for 15 s, a $200 nm-thick nanocrystalline Si layer with graded refractive index is formed on a Si surface, leading to an ultralow reflectance less than 3% in the wide wavelength region between 300 and 900 nm. However, the formation of the nanocrystalline Si layer greatly increases the surface area, similar to the case of other black Si structures such as nanocone, [7] nanowire [8,9] and porous Si, [10][11][12][13][14] which increases surface recombination rates. In order to suppress the surface recombination rates, we have developed an effective passivation method for the nanocrystalline Si layer, i.e., phosphosilicate glass (PSG) deposition plus heat treatment, and the internal quantum efficiency for short-wavelength light is greatly improved. [15][16][17] After the surface passivation processes, the nanocrystalline Si layer/Si solar cells generate a high shortcircuit photocurrent density ( J sc ) of 41.0 mA cm À2 even without anti-reflection coating, and the conversion efficiency of 19.5% has been achieved. [17] In the present study, we have developed a fabrication method to form ...