2011
DOI: 10.1111/j.1551-2916.2011.04862.x
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Effect of Yttria Content on the Zirconia Unit Cell Parameters

Abstract: The relationship between yttria concentration and the unit cell parameters in partially and fully stabilized zirconia has been reassessed, motivated by the need to improve the accuracy of phase analysis upon decomposition of t′-based thermal barrier coatings. Compositions ranging from 6 to 18 mol% YO 1.5 were synthesized and examined by means of high-resolution Xray diffraction. Lattice parameters were determined using the Rietveld refinement method, a whole-pattern fitting procedure. The revised empirical rel… Show more

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Cited by 109 publications
(97 citation statements)
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“…The out-of-plane YSZ lattice parameter determined from the position of the (004) reflection is 5.169(2) Å , slightly larger than the bulk value of around 5.14 Å . 15,16 The (00l) orientation of the YSZ film is compatible with the fourfold in-plane symmetry observed by RHEED. In the case of the thickest film (64 ML), a second peak at 2h $30 indicates the existence of crystallites with (111) orientation; from the intensity of XRD peaks its amount is estimated to be below around 10%, small enough not to cause any observable additional spots in the RHEED patterns.…”
supporting
confidence: 58%
“…The out-of-plane YSZ lattice parameter determined from the position of the (004) reflection is 5.169(2) Å , slightly larger than the bulk value of around 5.14 Å . 15,16 The (00l) orientation of the YSZ film is compatible with the fourfold in-plane symmetry observed by RHEED. In the case of the thickest film (64 ML), a second peak at 2h $30 indicates the existence of crystallites with (111) orientation; from the intensity of XRD peaks its amount is estimated to be below around 10%, small enough not to cause any observable additional spots in the RHEED patterns.…”
supporting
confidence: 58%
“…Table S1 shows the lattice parameters for all samples, averaging 5.1446 Å with small non-systematic deviations (0.001 Å) as a function of temperature. These numbers are all consistent with reports for zirconia powders with similar Y content [11]. Fig.…”
Section: Characterization Techniquessupporting
confidence: 81%
“…With an increase of the thermal treatment time, the Raman peak position shifted to a lower wave number. For the free standing coating, the Raman peak shift with annealing time can be attributed to decreasing anion disorder [37,38], which has been observed previously in APS YSZ coating. For the supported coating, there is another contribution from the stress.…”
Section: Residual Stressmentioning
confidence: 56%