2017
DOI: 10.1007/s40089-017-0217-z
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Effect of write voltage and frequency on the reliability aspects of memristor-based RRAM

Abstract: In this paper, we report the effect of the write voltage and frequency on memristor-based resistive random access memory (RRAM). The above-said parameters have been investigated on the linear drift model of the memristor. With a variation of write voltage from 0.2 to 1.2 V and a subsequent frequency modulation from 1, 2, 4, 10, 100 and 200 Hz, the corresponding effects on memory window, low resistance state (LRS) and high resistance state (HRS) have been reported. Thus, the lifetime (s) reliability analysis of… Show more

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Cited by 34 publications
(17 citation statements)
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“…The I – V , endurance and retention characteristics suggested the abrupt transition between two switching states (LRS and HRS) occurs in the Ag/Melanin/SS memristive device. The abrupt transition occurs only where the domination of filamentary conduction mechanism . In the present case, electron (free radical), as well as H + and OH − mobile ions, may be produced due to comproportionation reaction, where OH − mobile ion is considered as a proton hole, formed due to water molecules and hydrophilic residues .…”
Section: Resultsmentioning
confidence: 76%
“…The I – V , endurance and retention characteristics suggested the abrupt transition between two switching states (LRS and HRS) occurs in the Ag/Melanin/SS memristive device. The abrupt transition occurs only where the domination of filamentary conduction mechanism . In the present case, electron (free radical), as well as H + and OH − mobile ions, may be produced due to comproportionation reaction, where OH − mobile ion is considered as a proton hole, formed due to water molecules and hydrophilic residues .…”
Section: Resultsmentioning
confidence: 76%
“…Sweep voltages with smaller frequency tend to have larger memory window, which is one of the significant performance factors and such kind of high‐memory window is required for practical applications. [ 47–50 ] From Equation (), the high‐memory window can be correlated to longer liquid displacement in nanochannel, which inspires us to explore the physical picture behind the frequency response by taking account different interface displacements.…”
Section: Resultsmentioning
confidence: 99%
“…The resistance ( R 2 ) and capacitance ( C 2 ) corresponded to the semicircle at high frequencies (10 3 to 10 4 Hz) of the interface between the APP film and the electrodes in an approaching linear pinched‐loop, as previously reported. [ 47 ]…”
Section: Resultsmentioning
confidence: 99%