2022
DOI: 10.1016/j.chaos.2022.111999
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Effect of weight overlap region on neuromorphic system with memristive synaptic devices

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Cited by 11 publications
(8 citation statements)
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“…This implies that our research could offer valuable insights into the development of hardware systems to support clinical decisions. For instance, physical systems embodying SDU dynamics could be combined with neuromorphic devices [ [51] , [52] , [53] ], facilitating faster and more energy-efficient in-sensor intelligent diagnostics.…”
Section: Discussionmentioning
confidence: 99%
“…This implies that our research could offer valuable insights into the development of hardware systems to support clinical decisions. For instance, physical systems embodying SDU dynamics could be combined with neuromorphic devices [ [51] , [52] , [53] ], facilitating faster and more energy-efficient in-sensor intelligent diagnostics.…”
Section: Discussionmentioning
confidence: 99%
“…Besides, the stochastic current fluctuation by RTN, another intrinsic variation, can be also observed in memristive devices during the read operation due to the capture and emission of carriers in oxide traps. Especially, the RTN characteristics can be observed more frequently in HRS than LRS owing to longer tunneling distances caused by the rupture of conductive filaments [47,48]. This intrinsic variation can cause unstable read current characteristics when the inference operation is performed in a memristive neural network.…”
Section: Electrical Switching and Weight Transfer Characteristicsmentioning
confidence: 99%
“…Analogue-grade weight values can be realized with multilevel states between the HRS and LRS of the memristor device, and VMM operation can be conducted in parallel with applied voltage signals in a crossbar array in accordance with Ohm’s law and Kirchhoff’s current law. However, reliability issues persist in memristive devices, particularly concerning device-to-device (D2D) or cycle-to-cycle (C2C) variations arising due to the switching mechanism of memristive devices, which is predominantly based on the soft breakdown of dielectric layers. Such variations can significantly degrade the performance of neural networks as inaccurate device states hinder precise VMM operations and lead to computation errors. Although a memristor array structure with active devices such as a transistor has been demonstrated to improve cell selectivity, a passive crossbar array without active devices is advantageous for high-density integration of 4F 2 , thanks to the cross-point array structure. With increasing cell resistance to mitigate IR drop caused by line resistances, the sneak path current issue in the passive crossbar array can be suppressed by designing bias schemes such as half-V and third-V schemes. , While the sneak path issue can be effectively suppressed by self-rectifying or monolithic integrable selectors, it becomes negligible in a passive crossbar array as well during VMM operations because all the WLs and bitlines (BLs) are connected to known potential values, unlike stand-alone memory operations where most devices are on unselected WLs and BLs …”
Section: Introductionmentioning
confidence: 99%