2003
DOI: 10.1016/s0026-2714(03)00124-0
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Effect of voids on the reliability of BGA/CSP solder joints

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Cited by 139 publications
(51 citation statements)
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“…Based on the studies of void formation in Sn-Ag-Cu solder alloys on Cu substrate [2,5], it can be concluded that the characterization of voids is not negligible. By applying image analysis, the count and the area parameters were determined (Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…Based on the studies of void formation in Sn-Ag-Cu solder alloys on Cu substrate [2,5], it can be concluded that the characterization of voids is not negligible. By applying image analysis, the count and the area parameters were determined (Fig.…”
Section: Resultsmentioning
confidence: 99%
“…for the credible identification of 5-10 micron-sized voids [8]. Generally, the size, the count number and the area fraction of voids are examined in soldering bonds [8,9], but we have also found a study on the position of voids in BGA solder balls [5].…”
Section: Introductionmentioning
confidence: 91%
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“…The voids can produce cracking and failures during thermal cycling, as known in electronic technology. (Yunus et al, 2003). Bypass diodes are often mounted on the same substrate of the cells; for multijunctions solar cells these component assumes great importance due to the high sensitivity to reverse bias of these cells, protecting the devices against destructive reverse loads.…”
Section: Solar Cells Assembliesmentioning
confidence: 99%
“…Numerous studies have been conducted about the effect of voids. Among them, Yunus et al 17) showed that there is no significant difference in reliability between the solder joints with no voids and those with small voids (1-15% of the cross sectional area of the solder joint). Void diameters observed in this study ranged from 5 to 20 mm and were below 15% of the cross sectional area of the solder joint.…”
mentioning
confidence: 99%