1999
DOI: 10.1016/s0022-0248(99)00014-7
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Effect of trench structure on the quality of InGaAs layers grown on patterned GaAs (111) A substrates

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Cited by 20 publications
(11 citation statements)
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“…Recently, special attention has been paid to the selective epitaxial growth of III-V compound semiconductors to restrict defect propagation into the grown epitaxial layer. A number of recent articles have reported the selective growth of binary and ternary III-V semiconductors by LPE [6][7][8][9][10][11][12][13][14][15][16] and CCLPE [17][18][19][20]. Selective growth by LPE with changing mask layers and mask openings was also investigated [21][22].…”
Section: Introductionmentioning
confidence: 99%
“…Recently, special attention has been paid to the selective epitaxial growth of III-V compound semiconductors to restrict defect propagation into the grown epitaxial layer. A number of recent articles have reported the selective growth of binary and ternary III-V semiconductors by LPE [6][7][8][9][10][11][12][13][14][15][16] and CCLPE [17][18][19][20]. Selective growth by LPE with changing mask layers and mask openings was also investigated [21][22].…”
Section: Introductionmentioning
confidence: 99%
“…By using MCE, dislocation-free GaAs and InP epitaxial layers on Si substrates have been produced [4,5], and devices made up of an array of AlGaAs/GaAs lasers on a Si substrate have been fabricated [6]. The dislocation density has also been reduced by using liquid-phase epitaxy (LPE) for InGaAs/GaAs [7,8] and metalorganic vapor-phase epitaxy for GaN/SiC and GaN/sapphire [9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…By using this technique, dislocation-free GaAs and InP epitaxial layers even on Si substrate have been obtained [1][2][3][4] and new devices involving an array of AlGaAs/GaAs lasers on Si substrate have been fabricated [5]. The reduction of dislocation density has also been accomplished using LPE for InGaAs/GaAs [6,7] and metalorganic vapor phase epitaxy (MOVPE) for GaN/SiC and GaN/sapphire [8][9][10][11].…”
Section: Introductionmentioning
confidence: 99%