“…The film thickness, crystal structure, composition, microstructure and defect structure are determined by many factors such as sputtering power, substrate temperature, partial pressures of sputtering gas, sputtering time, and distance from target to substrate. 8,9) However, many studies for N-doped TiO 2 film have focused only on the nitrogen flow ratio. 5,6,10) Meanwhile, many researches have reported the relation between the nitrogen doping and the oxygen deficiency in TiO 2 .…”