Effect of Ti seed layer on the magnetization reversal process of Co/NiFe/Al-oxide/NiFe junction films

Abstract

Lorentz transmission electron microscopy and magnetic force microscopy characterization of NiFe/Al-oxide/Co films J. Appl. Phys. 91, 780 (2002); 10.1063/1.1427142 Effect of microstructure on the magnetoresistive properties of NiFe/Co(CoFe)/Al(Ta)-oxide/Co(CoFe) tunnel junctions

Formation of PbTiO3 thin films on seed layers using DC magnetron layer-by-layer deposition

“…The presence of a few nanometers of Ti or Ti/TiO 2 layer reduces the nucleation activation energy between depositing material and substrate and influences the phase, orientation, crystallites and grain sizes [25,26]. Yu et al [27] has also shown that a Ti seed layer can enhance the structural quality of ferromagnetic films giving a strong texture and large grain size. Sreemany et al [28] and Millon et al [29] have reported that interface energy minimization occurs using a TiO x (x < 2) seed layer which results in the crystallization of highly oriented PZT films on Pt substrates.…”

Switching properties and dynamic domain structures in double barrier magnetic tunnel junctions

“…The normal distribution of magnetic grains in the free layer was adopted. Each grain consists of a magnetic cubic cluster with the size of 20 nm  20 nm  4 nm: The validity and reliability of such a simulation method and its adopted parameters can be confirmed by a good fit to the main characters of the Lorentz transmission electron microscopy (LTEM) images of the MTJ magnetostructures under an electron beam, like a DC current, passing through the SBMTJ [20,21].…”

Soft magnetic properties of Ni<inf>81</inf>Fe<inf>19</inf> film with different substrates used for micro-fluxgate

“…et al [5] thought Ti seed layer could induce a strong (111) texture in bottom of Co/NiFe bilayer, and domain wall mobility was higher due to strong crystallographic texture and large grain size in the bilayer; Mao, M et al [6] had deposited Ta/NiFe films respectively using ion beam deposition, pulse, static magnetron sputtering, and indicated that the high quality crystallization is the reason for excellent magnetic properties; Nakatani et al [7] had investigated the magnetoresistance effects and film structures in [Fe-Mn/Ni-Fe/Cu/Ni-Fe/buffer/Si] sandwiches with various substrate layer materials, and found that Nb, Ta, Ti, Zr or Hf substrate layer can cause strong (111) texture, which Cu, Ag, Au and Cr cannot; Choe,G. et al [8] had investigated the surface roughness' effect on magnetics properties of Ta/NiFe, and found in a wide range of thickness of NiFe (111) smooth substrate could yield higher anisotropy and lower coercivity; Sharp, RW et al [9] had made the multilayer Cr/NiFe films, and reported that due to the exchange anisotropy between antiferromagnetic material(Cr) and ferromagnetic material(NiFe), crystal anisotropy, magnetostriction etc.…”