2006
DOI: 10.1016/j.jcrysgro.2005.10.079
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Effect of thermal annealing induced by p-type layer growth on blue and green LED performance

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Cited by 34 publications
(18 citation statements)
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“…It's promising to reduce the growth temperature of a p−GaN layer for better optical and structural properties of InGaN/GaN MQW [21]. The quality of InGaN/GaN MQW green LED could also be improved by "active−re− gion−friendly" p−InGaN layers grown at low temperature [22][23][24]. Figures 5(a)-5(d) show that structural of MQWs with a p−GaN layer grown at different temperature.…”
Section: Improvement Of Crystal Qualitymentioning
confidence: 99%
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“…It's promising to reduce the growth temperature of a p−GaN layer for better optical and structural properties of InGaN/GaN MQW [21]. The quality of InGaN/GaN MQW green LED could also be improved by "active−re− gion−friendly" p−InGaN layers grown at low temperature [22][23][24]. Figures 5(a)-5(d) show that structural of MQWs with a p−GaN layer grown at different temperature.…”
Section: Improvement Of Crystal Qualitymentioning
confidence: 99%
“…Taeil Jung et al demonstrated a semipolar green InGaN/GaN MQW fabricated on low cost c−plane sapphire substrates and achieved 30% higher inter− nal quantum efficiency than a conventional c−plane MQW [37]. In addition, bulk−GaN substrates with arbitrary orien− tations are attractive to grow a nonpolar and semipolar green LED such as (11)(12)(13)(14)(15)(16)(17)(18)(19)(20)(21)(22) orientation GaN [38,39], (20)(21) semipolar GaN [40,41], and a−plane GaN [42].…”
Section: Wave Functions Overlap Improvement Of Electrons and Holesmentioning
confidence: 99%
“…For p-type InGaN, it is well known that hole concentration can be enhanced as a consequence of reduced activation energy of Mg acceptor in In x Ga 1-x N with increasing indium composition, x In 11,12,13 . In this study, sample (a), which is In 0.04 Ga 0.96 N:Mg grown at 840°C, shows low resistivity with higher hole concentration (p=2.0×10 18 cm -3 and a low resistivity of 0.5 Ω-cm) due to the reduced Mg activation energy, as shown in Figure 3. The sample (a), however, shows lower carrier mobility (µ h~6 cm 2 /V·s) due to less-perfect crystalline quality relative to sample (b) or (c).…”
Section: Development Of P-type Gan and In X Ga 1-x N For Green Led P-mentioning
confidence: 83%
“…Figure 3 shows the measured hole concentration, mobility, and resistivity of the samples (a), (b), and (c). A high free-hole concentration of p=1.6×10 18 cm -3 and a mobility of µ h~1 2 cm 2 /V·s, resulting in a very low resistivity of 0.33 Ω-cm at 300 K for the GaN:Mg sample (c), which was grown under optimized growth condition at 1040°C, were achieved. As shown in Figure 5, secondary ion mass spectroscopy (SIMS) depth profiling for the sample reveals that carbon and oxygen impurity levels are well controlled -very low near detection limit.…”
Section: Development Of P-type Gan and In X Ga 1-x N For Green Led P-mentioning
confidence: 99%
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