Abstract:Data for reliability prediction of integrated circuits is obtained either from well designed accelerated life tests or from MIL‐HDBK‐217E. Although a number of researchers have questioned the validity of prediction based on the data derived from this standard, it continues to remain the main source of failure data. Manufacturers normally specify chip reliability by a single failure rate, which is known to be incorrect. In a chosen reliability test, devices fail with different failure mechanisms characterized b… Show more
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.