2017
DOI: 10.1007/s10854-016-6241-3
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Effect of the intermediate sulfide layer on the Cu2ZnSnS4-based solar cells

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Cited by 5 publications
(3 citation statements)
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“…Additionally, the use of EDS further confirms the presence of Cu 2 S by analyzing the elemental composition of these large grains. The combination of SEM and EDS provides an effective method for identifying and characterizing Cu 2 S secondary phase in CZTS films, aiding in the comprehensive analysis of their structural composition as reported in various studies [100,101]. Similarly, Buffiere et al, discovered particles measuring around 80 nm, situated at the base of the CZTSe film, which when analyzed by EDS found to be rich in Cu and Se, meaning the presence of Cu 2 Se [102].…”
Section: Morphological and Compositional Analysis Sem-edxmentioning
confidence: 97%
“…Additionally, the use of EDS further confirms the presence of Cu 2 S by analyzing the elemental composition of these large grains. The combination of SEM and EDS provides an effective method for identifying and characterizing Cu 2 S secondary phase in CZTS films, aiding in the comprehensive analysis of their structural composition as reported in various studies [100,101]. Similarly, Buffiere et al, discovered particles measuring around 80 nm, situated at the base of the CZTSe film, which when analyzed by EDS found to be rich in Cu and Se, meaning the presence of Cu 2 Se [102].…”
Section: Morphological and Compositional Analysis Sem-edxmentioning
confidence: 97%
“…In this study, to control the formation of non-uniformly distributed large voids and Cu–Sn alloy agglomeration, which leads to local compositional misfit and the formation of a secondary phase at the grain boundary, SnS was applied instead of metal Sn; the origin of the Cu–Sn alloy agglomeration was reported as liquid Sn . In the previous study, it was reported that the homogeneity of the CZTS thin film was improved when Sn was replaced with the SnS precursor . Also, it was reported that the closer SnS was to the substrate, the more suppressed was elemental loss .…”
Section: Introductionmentioning
confidence: 99%
“…11 In the previous study, it was reported that the homogeneity of the CZTS thin film was improved when Sn was replaced with the SnS precursor. 19 Also, it was reported that the closer SnS was to the substrate, the more suppressed was elemental loss. 20 In the case of using SnS/Cu/Zn stacked precursors in our base sulfoselenization process, it was impossible to fabricate because of the delamination problem during the device fabrication process.…”
Section: ■ Introductionmentioning
confidence: 99%