1996
DOI: 10.1016/0168-583x(95)01002-5
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Effect of the gas ambient on the intensity of the visible photoluminescence from Si microcrystallites in a SiO2 matrix formed by ion implantation

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Cited by 24 publications
(11 citation statements)
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“…This type of time dependence of the number of nanoparticles of small (2 nm) and large (16 nm) sizes results in F(R) transformation from the usual Gaussian function to a bimodal curve when the annealing time is increased from 15 to 120 min. This effect is accompanied with a spectral shift of the photoluminescence bands, which, in the opinion of the authors of some works [2,3], was in a fair agreement with the time dependence of the size of light-emitting nanoclusters.…”
supporting
confidence: 75%
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“…This type of time dependence of the number of nanoparticles of small (2 nm) and large (16 nm) sizes results in F(R) transformation from the usual Gaussian function to a bimodal curve when the annealing time is increased from 15 to 120 min. This effect is accompanied with a spectral shift of the photoluminescence bands, which, in the opinion of the authors of some works [2,3], was in a fair agreement with the time dependence of the size of light-emitting nanoclusters.…”
supporting
confidence: 75%
“…In view of the above, it is important to study the factors that under various conditions define the function of the size distribution of the quantum dots F(R). The problem is that, as indicated by analysis of the experimental data available up to now [2,3,7], silicon nanoparticles in high-concentration solutions are formed according to a scenario which in some respects differs from that described by the wellknown coalescence model [8,9].…”
mentioning
confidence: 99%
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“…The temperature held under the generation of Si nanocrystals was 950 °C, and their size was estimated as 4.3 nm [85]. In case of the creation of Si nanocrystals in dioxide by the Si + ion implantation and the high-temperature annealing at 1200 °C for 15 min, the effect of the RF plasma treatment on the PL intensity related to the exciton recombination in the nanocrystals was sufficiently visible (more than 3-fold enhancement) [10] and exceeded that under the thermal annealing in a forming gas at 450 °C [86] but was not such significant as in the above-mentioned case. At the same time, no increase of the PL intensity for amorphous Si inclusions that was obtained by the 700 ºC-annealing of a SiO x film deposited on a Si wafer by thermal evaporation of SiO in vacuum was observed [11].…”
Section: Effect Of Rf Plasma Treatment On Nanostructured Oxidementioning
confidence: 99%
“…Esta passivação é mais efetiva para as amostras preparadas a baixas T a sugerindo que a concentração de DBs é maior na fase amorfa. Estudo detalhado em filmes de Si amorfo mostra que difusão do H 2 não é fator limitante para passivação até mesmo a temperaturas de tratamento de 500 °C 184,215. Figura 51 -a) Valor médio das taxas de decaimento para energia de detecção E det = 1,63 eV em função da T a para as amostras tratadas sob atmosfera de Ar (círculos cheios) e Ar+5%H 2 (círculos vazios).…”
unclassified