2003
DOI: 10.1016/s0169-4332(03)00747-5
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Effect of the current density on the volume expansion of the deposited thin films of aluminum during porous oxide formation

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Cited by 60 publications
(48 citation statements)
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“…The influence of anodizing potential on the volume expansion factor was studied by Vrublevsky et al [247,404,405], for the anodization of aluminum conducted under a constant current density. Measurements were performed using a mechanical profiler with a computer signal processing for oxalic and sulfuric acids, whereupon the PBR was found to be linearly dependent on the anodizing potential (Table 1.…”
Section: Volume Expansion: the Pilling-bedworth Ratio (Pbr)mentioning
confidence: 99%
“…The influence of anodizing potential on the volume expansion factor was studied by Vrublevsky et al [247,404,405], for the anodization of aluminum conducted under a constant current density. Measurements were performed using a mechanical profiler with a computer signal processing for oxalic and sulfuric acids, whereupon the PBR was found to be linearly dependent on the anodizing potential (Table 1.…”
Section: Volume Expansion: the Pilling-bedworth Ratio (Pbr)mentioning
confidence: 99%
“…Anodic oxidation of aluminum is a volume expansion process, and thus accompanied by compressive stress along the metal/oxide film interface which was found to play a role in the self-ordering of oxide nanopores. [45,46] Since volume expansion factor is proportional to the current density j, [15,47,48] a very high level of stress can be expected during large oscillations of current. We believe that a consequence of nonuniform intense mechanical stresses at the metal/oxide interface is plastic deformation of aluminum substrate and the observed distorted pore channels in the anodic oxide film.…”
Section: Local Heat Developmentmentioning
confidence: 99%
“…The tracer studies supported earlier measurements of the rate of increase in pore wall height relative to stationary reference planes. [5][6][7] Both experiments revealed plastic flow in the pore walls at typical velocities of 0.1-1 nm/s. We developed a transport model of porous anodic alumina films, which validated the hypothesis of coupled electrical migration and viscous flow of oxide, through a detailed agreement with the tungsten tracer profiles.…”
mentioning
confidence: 92%