Articles you may be interested inBroadening effects and ergodicity in deep level photothermal spectroscopy of defect states in semi-insulating GaAs: A combined temperature-, pulse-rate-, and time-domain study of defect state kinetics Investigation of the annealing effect on the nonradiative carrier recombination in AlGaAs/GaAs utilizing the piezoelectric photothermal technique Rev. Sci. Instrum. 74, 550 (2003); 10.1063/1.1515888
Field-enhanced trapping in deep levels by multiple phonon emission in semi-insulating GaAsThe temperature variation of the piezoelectric photo-thermal ͑PPT͒ signal intensity of semi-insulating ͑SI͒ GaAs from 20 to 150 K was measured. Four peaks at 50, 70, 110, and 125 K were observed in the PPT signal. From the theoretical analysis based on the rate equations of electrons in the conduction band and deep levels, we concluded that the observed four peaks were due to the nonradiative electron transitions through EL6, EL7, EL15, and an unspecified deep level, respectively. Deep levels with extremely low concentration (10 12 -10 15 cm Ϫ3 ) were clearly identified in SI GaAs by using the PPT method.