Effect of Temperature of Electron Beam Evaporated CdSe Thin Films

Bathusha, Sahuban; Chandramohan, R.; Ta, Vijayan; S, Saravana Kumar; Kumar, Sri Hari Bharath Vinoth; Ayeshamariam, A.; Jayachandran, M.

doi:10.4172/2169-0022.1000297

Cited by 5 publications

(5 citation statements)

References 26 publications

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“…The XRD peak is appeared at diffraction angle 2θ of 25.457 o which corresponding to (002) crystalline plane of hexagonal wurtzite CdSe structure.. 2. Further, other low intensity of XRD peaks is appeared at 2θ of 46.0811 o that related to (103) crystalline plane in agreement with standard database [9][10][11]. The crystallite size of the (D) could be calculated using Scherrer's equation from full width at half maxima (FWHM) [11]:…”

Section: X-ray Diffraction Studiessupporting

confidence: 75%

“…Further, other low intensity of XRD peaks is appeared at 2θ of 46.0811 o that related to (103) crystalline plane in agreement with standard database [9][10][11]. The crystallite size of the (D) could be calculated using Scherrer's equation from full width at half maxima (FWHM) [11]:…”

Section: X-ray Diffraction Studiessupporting

confidence: 75%

“…The lattice planes have been represented by h, k, and l. Table 1 shows the results of calculating the crystallite size of thin film of CdSe. The XRD pattern's sharp and intense peaks demonstrate the films' good crystallinity and prove the stoichiometric nature regarding the CdSe films [11]. The…”

Section: X-ray Diffraction Studiesmentioning

confidence: 67%

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Fabrication of CdSe/Si Nanostructures Thin Films Heterojunction by DC Sputtering for Solar Cell Applications

Khudiar¹

2022

basjs

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CdSe nanocrystalin thin films were deposited onto silicon wafer using DC plasma sputtering method. Quantification of the crystalline size of CdSe thin films has been achieved by X-ray diffraction (XRD) technique. Otical properties of prepared CdSe thin films including absorption coefficient and optical band gap, have been analyzed and evaluated in the wavelength range of 250-850 nm. In addition, the current-voltage characteristics of a CdSe/Si hetero-junction have been examined, and the results show that lighting causes an increase in photo-current. The open circuit voltage was 2.0 V and the short circuit current was 0.18 mA. The abbreviation open circuit current is Voc.

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Section: X-ray Diffraction Studiessupporting

confidence: 75%

Section: X-ray Diffraction Studiessupporting

confidence: 75%

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Fabrication of CdSe/Si Nanostructures Thin Films Heterojunction by DC Sputtering for Solar Cell Applications

Khudiar¹

2022

basjs

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“…Keeping this in view, the present work reports the fabrication and utilization of Ta 2 O 5 thin films as electrochemical pH sensing material. Thin films of Ta 2 O 5 were prepared on glass substrates using E-beam coating technique due to its advantages such as good adhesion and chemical stability etc [6,21]. These films were further characterized using XRD, CCI and SEM techniques for structural, roughness and surface morphology studies, respectively.…”

Section: Introductionmentioning

confidence: 99%

Tantalum oxide thin films for electrochemical pH sensor

Sharma

Kumar

Kumari

et al. 2020

Mater. Res. Express

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Present work demonstrates the fabrication and utilization of tantalum oxide (Ta 2 O 5 ) thin films as prominent pH sensing electrode material. Ta 2 O 5 film of 1 μm thickness was deposited on glass substrates using physical vapor deposition technique. Structural and morphological studies were performed on these thin films. Electrochemical studies were carried out on these films using amperometry, linear sweep voltammetry and cyclic voltammetry techniques. These Ta 2 O 5 coated substrates were found to be sensitive to various assorted pH solutions and hence were used as pH sensing electrode. The performance of the electrode was studied in terms of stability, reusability and selectivity. Results reveal that the films were found to be suitable pH sensing material in 1.0-12.0 pH range. The sensing electrodes were found to be reliable and reusable with less than 5 s response time.

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“…There are a number of papers that report the results of morphological, structural, compositional, functional group, and optical characterization of thin films. These films were characterized using range of characterization techniques such as X-ray photoelectron spectroscopy (Lisco et al, 2015;Meng et al, 2015;Zhang et al, 2001;Subramanian et al, 2001), scanning electron microscopy (Remigijus et al, 2012;Anuar et al, 2010;Yazid et al, 2009;Murilo and Lucia, 2016;Salh et al, 2017;Amira and Hager, 2017), X-ray diffraction (Zulkefly et al, 2010;Saravanan et al, 2008;Kamoun et al, 2007;Ho et al, 2010;Sall et al, 2017;Kiran et al, 2017;Anitha et al, 2017;Kassim et al, 2011), transmission electron microscopy (Chen et al, 2016;Mukherjee et al, 2016a;Gallardo et al, 2016;Ghribi et al, 2016), energy dispersive X-ray analysis (Jelas et al, 2011;Deshmukh et al, 2017;Khan et al, 2017;Bakiyaraj and Dhanasekaran, 2013), Fourier transform infrared spectroscopy (Sahuban et al, 2016;Dedova et al, 2005;Taj and Tayyaba, 2012), and UV-Visible spectrophotometer Thirumavalavan et al, 2015;Ersin and Suleyman, 2015;Ramesh et al, 2014).…”

Section: Introductionmentioning

confidence: 99%

Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review

Soonmin¹

2017

Afr. J. Pure Appl. Chem.

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Sulfur, selenium and tellurium-based metal chalcogenide films have been prepared using various deposition methods. Investigation of morphological properties of the generated surface structures on chalcogenide thin films using atomic force microscopy technique was reported. The purpose of this work is to describe past important research findings that are related to atomic force microscopy technique.

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Effect of Temperature of Electron Beam Evaporated CdSe Thin Films

Cited by 5 publications

References 26 publications

Fabrication of CdSe/Si Nanostructures Thin Films Heterojunction by DC Sputtering for Solar Cell Applications

Fabrication of CdSe/Si Nanostructures Thin Films Heterojunction by DC Sputtering for Solar Cell Applications

Tantalum oxide thin films for electrochemical pH sensor

Atomic force microscopy studies on sulfur-, selenium- and tellurium-based metal chalcogenide thin films: A review

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