Effect of surface conditions and strain hardening on the passivity breakdown of 304 stainless steel

Souier, T.; Chiesa, Matteo

doi:10.1557/jmr.2012.5

Cited by 14 publications

(5 citation statements)

References 23 publications

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“…For instance, DRM could be employed to characterize rolling textures in FCC materials [16], which are often found to be parallel to the <101> crystallographic direction and affect the material's mechanical behavior. The rapid, high-throughput assessment of surface roughness information makes DRM a candidate technique for estimating the wettability of engineering surfaces [17,18] or for predicting corrosion susceptibility in structural materials [19]. Moreover, the ability to easily characterize GB curvature across the surface of polycrystals could be leveraged both for technological applications and fundamental studies.…”

Section: Discussionmentioning

confidence: 99%

Acquisition of partial grain orientation information using optical microscopy

2017

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Optical microscopy (OM) is often the first technique used to characterize surfaces of materials because of its simplicity and low cost. However, the information obtained by OM is usually limited to the geometry and spatial distribution of microstructural features. We present an advanced OM technique to perform quantitative microstructure analysis of polycrystalline metals and to assess partial grain orientation information from measurements of reflectance over a range of incident light directions. Our technique relies on the collection of a series of optical micrographs under controlled illumination conditions. We find a marked directiondependence of reflectance and ascribe it to sub-micron facets on the surfaces of individual grains. These surface facets are, in turn, correlated to grain orientation. We automate our technique via digital processing and numerical analysis of micrographs, enabling it to generate a wealth of microstructure data while remaining simple to use and inexpensive to implement.

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Section: Discussionmentioning

confidence: 99%

Acquisition of partial grain orientation information using optical microscopy

2017

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“…A more detailed description of the dual gain C-AFM setup can be found in previous work [31]. A highly doped boron-diamond tip (tip radius 80 nm [32], spring constant of 40 N/m) from Nanosensors was used to probe, with nanometric resolution, the electronic properties of the oxide layer [23,33]. The softwares Gwyddion and WSxM were used for C-AFM data processing [34,35].…”

Section: Methodsmentioning

confidence: 99%

Probing anodic oxidation kinetics and nanoscale heterogeneity within TiO2 films by Conductive Atomic Force Microscopy and combined techniques

Diamanti¹,

Souier²,

Stefancich³

et al. 2014

Electrochimica Acta

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“…Changes in the structure of the passive film formed on pure iron [64], Ti6Al4Valloy [65], and 304 stainless steel [66] were also considered to explain the influence of plastic deformation in the increase of corrosion susceptibility. The adsorption energy of oxygen on a Cu (100) surface affects the build-up of Cu 2 O oxide films dependent on the stress applied to the substrate [67].…”

Section: Modifications Of the Passive Filmmentioning

confidence: 99%