2009 IEEE International Conference on Plasma Science - Abstracts 2009
DOI: 10.1109/plasma.2009.5227647
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Effect of surface charge trapping in dielectric barrier discharge

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Cited by 4 publications
(8 citation statements)
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“…Finally, we note that the temporal profiles of electron emission computed in this section are qualitatively consistent with the observed temporal profiles of plasma formation reported in the literature [32][33][34][35]. We have shown that electron transfer from the dielectric to the argon region under an AC voltage is time-dependent, and that the dielectric region can provide electrons for plasma generation.…”
Section: Electron Transfer At Constant Maximum Electric Fieldsupporting
confidence: 89%
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“…Finally, we note that the temporal profiles of electron emission computed in this section are qualitatively consistent with the observed temporal profiles of plasma formation reported in the literature [32][33][34][35]. We have shown that electron transfer from the dielectric to the argon region under an AC voltage is time-dependent, and that the dielectric region can provide electrons for plasma generation.…”
Section: Electron Transfer At Constant Maximum Electric Fieldsupporting
confidence: 89%
“…In the case of dielectric-gas-dielectric systems under AC voltage, degeneracies between localized states within and outside the dielectric surface appear due to time-dependent energy level crossing, leading to the possibility of time-dependent electron transfer. The temporal profile of current-voltage phase lag, as well as surface charge accumulation and depletion obtained from our computations using simple energy level crossing arguments, are consistent with experimental observations in the literature [32][33][34][35], but quantitative agreement with experiments requires more detailed computations coupling electron transfer from dielectric surfaces with the kinetics of plasma formation, and are beyond the scope of this work. difference is applied, a linear potential drop is expected across various insulating parts of the device, according to their relative permittivity r , and we are interested in the timedependent transfer of electrons from the dielectric into the gaseous argon under a timedependent potential V ext (t).…”
Section: Introductionsupporting
confidence: 86%
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“…As the barrier increases in thickness, the capacitance due to the barrier decreases resulting in a greater voltage drop across the barrier, and less voltage applied across the gas gap. This results in a reduced power applied to the plasma region, reducing the electron density and chance of collisions in the gas space, and leading to lower concentration of ions and excited atoms formed in the plasma [57][58][59][60]. It was observed that the MB degradation using the microfluidic device was greatest using an overall 2 mm barrier thickness, with 50 µm channel depth and 35 µL/min as the liquid flow rate.…”
Section: Effect Of Barrier Thicknessmentioning
confidence: 99%