Effect of Static Lifetime and Dynamic Lifetime Test on Reliability of Power Amplifier Chips

Yang, Liting; Deng, Chuanjin; Wang, Zhizhe; Chen, Si; Mao, Mao; Ren, Yan

doi:10.1109/ceepe51765.2021.9475733

2021 4th International Conference on Energy, Electrical and Power Engineering (CEEPE) 2021

DOI: 10.1109/ceepe51765.2021.9475733

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Effect of Static Lifetime and Dynamic Lifetime Test on Reliability of Power Amplifier Chips

Liting Yang

Chuanjin Deng

Zhizhe Wang

et al.

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Effect of Static Lifetime and Dynamic Lifetime Test on Reliability of Power Amplifier Chips

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References 14 publications

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