2012
DOI: 10.1080/00150193.2012.741952
|View full text |Cite
|
Sign up to set email alerts
|

Effect of Sol-Gel PZT Film Thickness on the Hysteresis Properties

Abstract: An effect of the thickness of ferroelectric sol-gel PZT films on the dielectric hysteresis behavior is studied. Ferroelectric Pb(Zr 0.48 Ti 0.52 )О 3 films with the thickness from 95 to 340 nm are studied. It has been found that the decrease in the film thickness leads to a decrease in the residual polarization and the steepness of the hysteresis loops, while the coercive field increases. At the same time the offset of the hysteresis loop along the voltage axis shows no definite dependence on the film thicknes… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
3
0

Year Published

2016
2016
2019
2019

Publication Types

Select...
2
1

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(3 citation statements)
references
References 8 publications
0
3
0
Order By: Relevance
“…It should be noted that thicker porous film (d = 2180 nm) demonstrates higher k value than thinner one (d = 1177 nm) with lower porosity. The reason is an effect of disturbing («dead») nonferroelectric layer on the ferroelectricmetal interface, whose impact increases with decreasing film thickness [9,10]. The dense film has typical perovskite columnar grain structure with the mean grain size ~ 100 nm and mixed (111) and (100) texture [7].…”
Section: Sample Characterizationmentioning
confidence: 99%
“…It should be noted that thicker porous film (d = 2180 nm) demonstrates higher k value than thinner one (d = 1177 nm) with lower porosity. The reason is an effect of disturbing («dead») nonferroelectric layer on the ferroelectricmetal interface, whose impact increases with decreasing film thickness [9,10]. The dense film has typical perovskite columnar grain structure with the mean grain size ~ 100 nm and mixed (111) and (100) texture [7].…”
Section: Sample Characterizationmentioning
confidence: 99%
“…), and so-called "dead layers". [1][2][3][4][5][6][7][8][9][10] As a rule, the thickness effects are studied by comparison of capacitance of samples with different ferroelectric film thicknesses. The thickness dependence of the effective dielectric constant can be obtained by assuming that a non-ferroelectric layer (dead layer) exists at the metal-ferroelectric interface.…”
mentioning
confidence: 99%
“…Table I shows the obtained values of the bulk permittivity e b , the capacity C d , and the dead layer thickness l ss obtained by the smallsignal capacitance technique. [1][2][3][4][5]8 The optical permittivity of PZT films was obtained from ellipsometric measurements as e d ¼ n 2 .…”
mentioning
confidence: 99%