Effect of Slit Width on the Results of Small-Angle X-Ray Diffraction

Abstract

X-ray diffraction analysis is a convenient and important route to investigate crystalline materials. With mesoporous materials, Al-SBA-15 as target, the effects of scatter slit, soller slit and receiving slit of Bruker D8 ADVANCE diffractometer on the small-angle diffraction pattern based on information, such as the background intensity, peak height, intensity and full width at half maximum, which provide the evidence for slits selection.