2017
DOI: 10.1080/00150193.2017.1369829
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Effect of sintering temperature and Cu-rich secondary phase on dielectric properties of microwave processed CaCu3Ti4O12 ceramics

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Cited by 15 publications
(13 citation statements)
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“…DC gold sputtering was used for surface coating to avoid electron accumulation during FESEM study. This whole synthesis procedure was also reported in our previous work [1]. Abbreviations used for the samples are CCTO1, CCTO2, CCTO3 and CCTO4 in accordance with successive increase in the sintering temperature (from 1000 to 1075°C).…”
Section: Methodsmentioning
confidence: 80%
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“…DC gold sputtering was used for surface coating to avoid electron accumulation during FESEM study. This whole synthesis procedure was also reported in our previous work [1]. Abbreviations used for the samples are CCTO1, CCTO2, CCTO3 and CCTO4 in accordance with successive increase in the sintering temperature (from 1000 to 1075°C).…”
Section: Methodsmentioning
confidence: 80%
“…Co-K α (λ = 1.789010 Å) radiation (Bruker D8) was used for X-ray diffraction study. Structural refinement was carried out by Rietveld analysis using cubic CCTO with monoclinic CuO secondary phase, which was reported earlier [1]. Dielectric properties were previously studied [1] as a function of frequency (100 Hz to 1 MHz) and temperature (room temperature to 150°C).…”
Section: Methodsmentioning
confidence: 99%
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