“…When sampling atmospheric particles, artifacts are typically due to collection of gases on a sampling substrate or volatilization of sample already collected. Determining the impact of an artifact on the measurement may be complicated (e.g., Chow, 1995;Hering and Cass, 1999;Solomon et al, 2000;Turpin et al, 2000;Kim et al, 2001;Pang et al, 2002;Ashbaugh et al, 2004aAshbaugh et al, , 2004bSubramanian et al, 2004;Chow et al, 2005aChow et al, , 2005bKim et al, 2005;White et al, 2005;Yu et al, 2006;Watson et al, 2009;Chow et al, 2010;Maimone et al, 2011). Sampling artifacts are primarily associated with semivolatile components in organic carbon and ammonium nitrate.…”