2015
DOI: 10.1007/s12034-015-0881-4
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Effect of RF power and gas flow ratio on the growth and morphology of the PECVD SiC thin film s for MEMS applications

Abstract: Low temperature PECVD (Plasma Enhanced Chemical Vapour Deposition) deposited SiC thin films are promising materials for development of high temperature working MEMS (Microelectromechanical System) due to their excellent mechanical properties, non-corrosive nature and ability to withstand high temperature. However, the surface roughness of such thin films is the main obstacle to achieve thicker thin films for MEMS applications as the surface more rougher by increasing the thickness of PECVD SiC thin films. Ther… Show more

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Cited by 8 publications
(6 citation statements)
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“…It is possible that as the RF power increased, more Ar ions accelerated to hit the Ni target under high power, resulting in more Ni particles being ejected from the target with increased kinetic energy and velocity, resulting in a faster deposition rate. The high sputtering power improved the crystallization of the Ni films and aided in the formation of the Ni films with highly dense microstructures, which, as a result, led to a reduction in the resistivity [22,23]. To check the surface morphology of the Ni films deposited at various RF powers, FESEM images were taken and are shown in Figure 3.…”
Section: Resultsmentioning
confidence: 99%
“…It is possible that as the RF power increased, more Ar ions accelerated to hit the Ni target under high power, resulting in more Ni particles being ejected from the target with increased kinetic energy and velocity, resulting in a faster deposition rate. The high sputtering power improved the crystallization of the Ni films and aided in the formation of the Ni films with highly dense microstructures, which, as a result, led to a reduction in the resistivity [22,23]. To check the surface morphology of the Ni films deposited at various RF powers, FESEM images were taken and are shown in Figure 3.…”
Section: Resultsmentioning
confidence: 99%
“…Low frequency RF (40 Hz) power and pressure of range 700−1000 Torr, along with changes in the precursor ratios were utilized for the production of films of varying electrical and mechanical properties. The results indicate the potential of the α-SiC films as structural components for devices that need stable residual film stress at high temperatures of operation [36]. Although the thin films of SiC have demonstrated promise in the development of high temperature withstanding MEMS devices, the increase in surface roughness in deposited thicker films remains an obstacle.…”
Section: Semiconductor Devicesmentioning
confidence: 95%
“…The internal plasma parameters that affect the final polymerized film, include homogeneity of discharge, distribution of various species in the plasma, and energy of the species, and the external plasma parameters include reactor geometry, applied voltage, frequency, total pressure, and flow rate [32,36]. Some of the parameters can be modified to create different variants of this technique, namely temperature, length of the deposition, pressure, inert gas flow rate, method of plasma production, and the power of the source.…”
Section: Variation Of Pressure For Plasma Productionmentioning
confidence: 99%
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“…For example, silicon-based PECVD coatings including hydrogenated amorphous silicon or silicon-based compound materials such as SiON or SiC are nowadays spread in this industrial sector. Some applications in this field include SiON and SiN as insulating layers for metal-insulator-metal capacitors [279] or the utilization of SiC coatings in MEMS devices [280]. These coatings are also commonly used as barrier coatings to encapsulate devices to protect them from outside contaminants and humidity.…”
Section: Application Of Pecvd Technologiesmentioning
confidence: 99%