“…After the samples reached the equilibrium pressure, the temperature was changed at a rate of ±1 K min -1 using a He compressor, until the desired T for the experiments (300 K, 100 K, 77 K or 50 K). The XRD analysis was made using a Mo radiation source (Mo Kα, λ = 0.07107 nm, 50 kV, 30 mA), from 3 o to 90 o , conducted for 12 h [12,18]. In order to obtain the XRD information of only the gas adsorbed in the ACF, it was necessary to obtain the XRD scattering of i) background (only sample cell, without sample, under vacuum), ii) only the ACF, under vacuum, and iii) gas adsorbed on the desired ACF, all of them at the same desired temperature.…”