Abstract:In this work, a single micro-size circular and rectangular holes were fabricated in phosphorus/tin implanted germanium substrate using ion milling of FIB, for potential application in photonic crystal and FINFET. One of the important analysis that need to be done in the future is a cross-sectional analysis in order to evaluate the milling rate of material, redeposition of milled material, and the quality of the milled surface in the pattern structure. However, a well-known practise in preparing a cross-section… Show more
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