“…There are numerous AM process variables, e.g., beam parameters [ 1 , 2 , 3 ], scanning parameters (pattern, speed, power) [ 4 , 5 , 6 , 7 , 8 , 9 , 10 ], powder characteristics and distribution [ 11 , 12 , 13 ], which can induce internal defects and largely affect the surface roughness. For example, Yang et al.…”